Structural characterization of magnetron sputtered ZnO thin films on Si(100) using RBS, scanning and high resolution transmission electron microscopy methods

2019 ◽  
Vol 15 ◽  
pp. 239-243 ◽  
Author(s):  
R.M. Nagabharana ◽  
N. Kiran ◽  
Puspendu Guha ◽  
B. Sundaravel ◽  
Umananda M. Bhatta
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Structural Characterization ◽  
Zno Thin Films ◽  
Transmission Electron

X-ray and transmission electron microscopy structural characterization of multifunctional Perovskite thin films

2012 ◽  
Vol 520 (14) ◽  
pp. 4608-4612
Author(s):  
M. Boudard ◽  
C. Girardot ◽  
N. Ihzaz ◽  
S. Pignard ◽  
L. Rapenne ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Structural Characterization ◽  
X Ray ◽  
Transmission Electron
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