Structural characterization of Al
0.55
Ga
0.45
N epitaxial layer determined by high resolution x-ray diffraction and transmission electron microscopy
1991 ◽
Vol 111
(1-4)
◽
pp. 456-460
◽
2005 ◽
Vol 19
(15n17)
◽
pp. 2508-2513
◽
1993 ◽
Vol 127
(1-4)
◽
pp. 596-600
◽
1992 ◽
Vol 222
(1-2)
◽
pp. 221-226
◽
1982 ◽
Vol 40
◽
pp. 722-723
◽