Grain dependence of ferroelectric domain switching on SrBi2Ta2O9 thin films observed by Kelvin probe force microscope

2006 ◽  
Vol 500 (1-2) ◽  
pp. 360-363 ◽  
Author(s):  
J.Y. Son ◽  
Bog G. Kim ◽  
J.H. Cho
2007 ◽  
Vol 51 (12) ◽  
pp. 143 ◽  
Author(s):  
K. S. SONG ◽  
C. H. KIM ◽  
H. B. MOON ◽  
S. S. MIN ◽  
J. H. CHO

2011 ◽  
Vol 17 (S2) ◽  
pp. 1364-1365
Author(s):  
M-G Han ◽  
M Schofield ◽  
L Wu ◽  
C Ma ◽  
J Pulecio ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.


2004 ◽  
Vol 84 (25) ◽  
pp. 5085-5087 ◽  
Author(s):  
Yong Kwan Kim ◽  
Sang Sub Kim ◽  
Hyunjung Shin ◽  
Sunggi Baik

2011 ◽  
Vol 04 (01) ◽  
pp. 91-95 ◽  
Author(s):  
AMIT KUMAR ◽  
FENG YAN ◽  
KAIYANG ZENG ◽  
LI LU

BiFeO 3 (BFO) is usually considered as a multiferroic material, which shows both ferroelectric and antiferromagnetic properties at room temperature. It is an important material having potential applications in various spintronics devices. Many studies have been done to understand the ferroelectric and magnetic responses of BFO; therefore, this work is focused on characterizing the coupling effects of electric, magnetic and mechanical field on the ferroelectric properties and surface potential of the BFO thin films. A polycrystalline BFO film (~200 nm) is deposited on the Si substrate by the Pulse Laser Deposition techniques. The Vertical Piezoresponse Force Microscopy (PFM) is used to study the ferroelectric domain structure and the hysteresis loop of as-deposited BFO film as well as the effects of the mechanical stress and magnetic field on those properties. Kelvin Probe Force Microscopy (KPFM) is used to measure the surface potential of the samples. To apply the mechanical stress on the film, micro-indentations were made on the surface of the film with two different loads (1.96 N, 2.94 N). Then the ferroelectric domain structure, strain amplitude, domain switching (hysteresis response) behavior and surface potential are measured at the locations near the side of the indentation cavity and cracks. This way, the coupling effects of electric, magnetic and stress field on BFO film are studied at nanoscale.


Author(s):  
Arundhati H. Patil ◽  
S.S. Kulkarni ◽  
Bibi Raza Khanam ◽  
U.V. Khadke

2007 ◽  
Vol 101 (10) ◽  
pp. 104105 ◽  
Author(s):  
A. Q. Jiang ◽  
Y. Y. Lin ◽  
T. A. Tang

2014 ◽  
Vol 8 (6) ◽  
pp. 522-526 ◽  
Author(s):  
Martin Schmidbauer ◽  
Jan Sellmann ◽  
Dorothee Braun ◽  
Albert Kwasniewski ◽  
Andreas Duk ◽  
...  

Polymer ◽  
2013 ◽  
Vol 54 (21) ◽  
pp. 5733-5740 ◽  
Author(s):  
X.G. Briones ◽  
M.D. Urzúa ◽  
H.E. Ríos ◽  
F.J. Espinoza-Beltrán ◽  
R. Dabirian ◽  
...  

2017 ◽  
Vol 56 (10S) ◽  
pp. 10PF16
Author(s):  
Yoshiomi Hiranaga ◽  
Takanori Mimura ◽  
Takao Shimizu ◽  
Hiroshi Funakubo ◽  
Yasuo Cho

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