Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(0001¯) using photoelectron emission microscopy

2013 ◽  
Vol 130 ◽  
pp. 94-100 ◽  
Author(s):  
N. Barrett ◽  
K. Winkler ◽  
B. Krömker ◽  
E.H. Conrad
Keyword(s):  
Electronic Structure ◽  
Reciprocal Space ◽  
Photoelectron Emission ◽  
Layer Graphene ◽  
Emission Microscopy ◽  
Few Layer Graphene ◽  
Photoelectron Emission Microscopy

scholarly journals Energy-filtered Photoelectron Emission Microscopy (EF-PEEM) for imaging nanoelectronic materials

2007 ◽  
Author(s):  
Olivier Renault ◽  
Amal Chabli ◽  
David G. Seiler ◽  
Alain C. Diebold ◽  
Robert McDonald ◽  
...  
Keyword(s):  
Photoelectron Emission ◽  
Emission Microscopy ◽  
Photoelectron Emission Microscopy
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