EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
Latest Publications

TOTAL DOCUMENTS

419

(FIVE YEARS 0)

H-INDEX

3

(FIVE YEARS 0)

Published By Springer Berlin Heidelberg

9783540852254, 9783540852261

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Influence of thermal treatments in microstructure and recrystallization peak energy of P/M Al-Mg-X alloys

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_201 ◽

2008 ◽

pp. 401-402

Author(s):

S. J. Buso ◽

A. Almeida Filho ◽

I. M. Espósito ◽

J. R. Matos ◽

W. A. Monteiro

Keyword(s):

Thermal Treatments ◽

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Determination of interface structure of YBCO/LCMO by a spherical aberration- corrected HRTEM

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_190 ◽

2008 ◽

pp. 379-380

Author(s):

Z. L. Zhang ◽

U. Kaiser ◽

S. Soltan ◽

H. -U. Habermeier

Keyword(s):

Spherical Aberration ◽

Interface Structure ◽

Aberration Corrected

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Comparison of transmission electron microscopy methods to measure layer thicknesses to sub-monolayer precision

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_189 ◽

2008 ◽

pp. 377-378

Author(s):

T. Walther

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron

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HR-STEM EELS analysis of silicon 32 nm technology using a TITAN with a probe Cs corrector

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_17 ◽

2008 ◽

pp. 33-34

Author(s):

R. Pantel ◽

J. L Rouvière ◽

E. Gautier ◽

S. Denorme ◽

C. Fenouiller-Beranger ◽

...

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Investigation of the change in the microstructure of thin p-type Bi-Sb-Te thermoelectric films after heat treatment

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_169 ◽

2008 ◽

pp. 337-338

Author(s):

F. Heyroth ◽

M. Schade ◽

K. Rothe ◽

H. S. Leipner ◽

M. Stordeur

Keyword(s):

Heat Treatment ◽

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Strain in SrTiO3 layers embedded in a scandate/titanate multilayer system

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_163 ◽

2008 ◽

pp. 325-326

Author(s):

D. Ávila ◽

M. Boese ◽

T. Heeg ◽

J. Schubert ◽

M. Luysberg

Keyword(s):

Multilayer System

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Investigation of organic/inorganic interfaces using nano-analytical transmission electron microscopy

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_161 ◽

2008 ◽

pp. 321-322

Author(s):

V. Jantou ◽

M. A. Horton ◽

D. W. McComb

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Analytical Transmission Electron Microscopy ◽

Transmission Electron

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Structure and stability of core-shell AuAg nanopartciels

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_153 ◽

2008 ◽

pp. 305-306

Author(s):

Z. Y. Li ◽

R. Merrifield ◽

Y. Feng ◽

J. P. Wilcoxon ◽

R. E. Palmer ◽

...

Keyword(s):

Structure And Stability

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A novel procedure for an accurate estimation of the lattice parameter of supported metal nanoparticles from the analysis of plan view HREM images

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_120 ◽

2008 ◽

pp. 239-240

Author(s):

C. Mira ◽

J. A. Perez-Omil ◽

J. J. Calvino ◽

S. Bernal

Keyword(s):

Metal Nanoparticles ◽

Lattice Parameter ◽

Accurate Estimation ◽

Plan View ◽

Supported Metal Nanoparticles ◽

Supported Metal

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Electron beam-induced effects on copper nanoparticles: coarsening and generation of twins

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_102 ◽

2008 ◽

pp. 203-204

Author(s):

D. Díaz-Droguett ◽

V. Fuenzalida ◽

G. Solórzano

Keyword(s):

Electron Beam ◽

Copper Nanoparticles

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