EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
Latest Publications

TOTAL DOCUMENTS

419

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By Springer Berlin Heidelberg

9783540852254, 9783540852261

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Characterisation of Gold Nanocomposites by SEM, TEM and EBSD

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_344 ◽

2008 ◽

pp. 687-688

Author(s):

D. Dietrich ◽

Th. Lampke ◽

B. Wielage ◽

P. Cojocaru ◽

P. L. Cavallotti

Keyword(s):

Gold Nanocomposites

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Microstructure of cobalt nanocluster arrays fabricated by solid-state dewetting

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_123 ◽

2008 ◽

pp. 245-246

Author(s):

Yong-Jun Oh ◽

Junghwan Kim ◽

Sukhun Hwang ◽

Caroline A. Ross ◽

Carl V. Thompson

Keyword(s):

Solid State

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Dislocations in AlPdMn quasicrystals: contrast in TEM and physical properties

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_318 ◽

2008 ◽

pp. 635-636

Author(s):

D. Caillard ◽

F. Mompiou

Keyword(s):

Physical Properties

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Electron microscopy analysis of Mn partitioning in retained austenite- martensite- bainite islands

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_231 ◽

2008 ◽

pp. 461-462

Author(s):

A. Lis ◽

J. Lis ◽

P. Wieczorek

Keyword(s):

Electron Microscopy ◽

Retained Austenite ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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Influence of thermal treatments in microstructure and recrystallization peak energy of P/M Al-Mg-X alloys

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_201 ◽

2008 ◽

pp. 401-402

Author(s):

S. J. Buso ◽

A. Almeida Filho ◽

I. M. Espósito ◽

J. R. Matos ◽

W. A. Monteiro

Keyword(s):

Thermal Treatments ◽

Peak Energy

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Determination of interface structure of YBCO/LCMO by a spherical aberration- corrected HRTEM

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_190 ◽

2008 ◽

pp. 379-380

Author(s):

Z. L. Zhang ◽

U. Kaiser ◽

S. Soltan ◽

H. -U. Habermeier

Keyword(s):

Spherical Aberration ◽

Interface Structure ◽

Aberration Corrected

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Comparison of transmission electron microscopy methods to measure layer thicknesses to sub-monolayer precision

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_189 ◽

2008 ◽

pp. 377-378

Author(s):

T. Walther

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron

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HR-STEM EELS analysis of silicon 32 nm technology using a TITAN with a probe Cs corrector

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_17 ◽

2008 ◽

pp. 33-34

Author(s):

R. Pantel ◽

J. L Rouvière ◽

E. Gautier ◽

S. Denorme ◽

C. Fenouiller-Beranger ◽

...

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Investigation of the change in the microstructure of thin p-type Bi-Sb-Te thermoelectric films after heat treatment

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_169 ◽

2008 ◽

pp. 337-338

Author(s):

F. Heyroth ◽

M. Schade ◽

K. Rothe ◽

H. S. Leipner ◽

M. Stordeur

Keyword(s):

Heat Treatment ◽

P Type

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Strain in SrTiO3 layers embedded in a scandate/titanate multilayer system

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_163 ◽

2008 ◽

pp. 325-326

Author(s):

D. Ávila ◽

M. Boese ◽

T. Heeg ◽

J. Schubert ◽

M. Luysberg

Keyword(s):

Multilayer System

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EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, GermanyLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Characterisation of Gold Nanocomposites by SEM, TEM and EBSD

Microstructure of cobalt nanocluster arrays fabricated by solid-state dewetting

Dislocations in AlPdMn quasicrystals: contrast in TEM and physical properties

Electron microscopy analysis of Mn partitioning in retained austenite- martensite- bainite islands

Influence of thermal treatments in microstructure and recrystallization peak energy of P/M Al-Mg-X alloys

Determination of interface structure of YBCO/LCMO by a spherical aberration- corrected HRTEM

Comparison of transmission electron microscopy methods to measure layer thicknesses to sub-monolayer precision

HR-STEM EELS analysis of silicon 32 nm technology using a TITAN with a probe Cs corrector

Investigation of the change in the microstructure of thin p-type Bi-Sb-Te thermoelectric films after heat treatment

Strain in SrTiO3 layers embedded in a scandate/titanate multilayer system

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany
Latest Publications