StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images
2016 ◽
Vol 171
◽
pp. 104-116
◽
A. De Backer
◽
K.H.W. van den Bos
◽
W. Van den Broek
◽
J. Sijbers
◽
S. Van Aert
2017 ◽
Vol 902
◽
pp. 012013
◽
A De Backer
◽
K H W van den Bos
◽
W Van den Broek
◽
J Sijbers
◽
S Van Aert
2021 ◽
Vol 27
(S1)
◽
pp. 2900-2901
Blanka Janicek
◽
Priti Kharel
◽
Sang hyun Bae
◽
Pinshane Huang
1993 ◽
Vol 49
(6)
◽
pp. 951-958
◽
M. Sundberg
◽
N. D. Zakharov
◽
I. P. Zibrov
◽
Yu. A. Barabanenkov
◽
V. P. Filonenko
◽
...
2013 ◽
Vol 52-53
◽
pp. 67
2004 ◽
Vol 334-335
◽
pp. 194-197
◽
2020 ◽
Vol 20
(1)
◽
pp. 62-67
◽
Abinash Kumar
◽
Jonathon N. Baker
◽
Preston C. Bowes
◽
Matthew J. Cabral
◽
Shujun Zhang
◽
...
1993 ◽
Vol 67
(4)
◽
pp. 293-300
◽
Zhu Shixue
◽
Wang Yuanming
◽
Wang Shaoqing
1987 ◽
Vol 22
(1-4)
◽
pp. 57-70
◽
K.L. Merkle
◽
David J. Smith