scholarly journals StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images

2016 ◽  
Vol 171 ◽  
pp. 104-116 ◽  
Author(s):  
A. De Backer ◽  
K.H.W. van den Bos ◽  
W. Van den Broek ◽  
J. Sijbers ◽  
S. Van Aert
2020 ◽  
Vol 20 (1) ◽  
pp. 62-67 ◽  
Author(s):  
Abinash Kumar ◽  
Jonathon N. Baker ◽  
Preston C. Bowes ◽  
Matthew J. Cabral ◽  
Shujun Zhang ◽  
...  

1987 ◽  
Vol 22 (1-4) ◽  
pp. 57-70 ◽  
Author(s):  
K.L. Merkle ◽  
David J. Smith

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