Nanometer-precise optical length measurement using near-field scanning optical microscopy with sharpened single carbon nanotube probe
2018 ◽
Vol 186
◽
pp. 18-22
◽
Takehiro Tachizaki
◽
Toshihiko Nakata
◽
Kaifeng Zhang
◽
Ichiro Yamakawa
◽
Shin-ichi Taniguchi
1998 ◽
Vol 73
(22)
◽
pp. 3229-3231
◽
Charles Hubert
◽
Jeremy Levy
1995 ◽
Vol 67
(17)
◽
pp. 2483-2485
◽
C. L. Jahncke
◽
M. A. Paesler
◽
H. D. Hallen
1995 ◽
Vol 61
(1-4)
◽
pp. 291-294
◽
Patrick J. Moyer
◽
Stefan Kämmer
◽
Karsten Walzer
◽
Michael Hietschold
M.S. Unlu
◽
B.B. Goldberg
◽
W.D. Herzog
◽
H.F. Ghaemi
◽
E. Towe
2016 ◽
Vol 49
(17)
◽
pp. 6439-6444
◽
Shiran Nabha-Barnea
◽
Nitzan Maman
◽
Iris Visoly-Fisher
◽
Rafi Shikler
2001 ◽
Vol 17
(20)
◽
pp. 6051-6055
◽
Xiangmin Liao
◽
Daniel A. Higgins
1999 ◽
Vol 452
(3)
◽
pp. 223-227
◽
Vladimir P Shinkarev
◽
Robert Brunner
◽
Jeffrey O White
◽
Colin A Wraight
2004 ◽
Vol 1
(9)
◽
pp. 2292-2297
◽
E. E. van Dyk
◽
A. Karoui
◽
A. H. La Rosa
◽
G. Rozgonyi
1999 ◽
Vol 194
(2-3)
◽
pp. 445-447
◽
2001 ◽
Vol 62
(9-10)
◽
pp. 1643-1655
◽
Czek Haan Tan
◽
Anto Regis Inigo
◽
Jui-Hung Hsu
◽
Wunshain Fann
◽
Pei-Kuen Wei