scholarly journals First- and second-order transformational apparent motion rely on common shape representations

2021 ◽  
Vol 188 ◽  
pp. 246-250
Author(s):  
K.C. Hartstein ◽  
S. Saleki ◽  
K. Ziman ◽  
P. Cavanagh ◽  
P.U. Tse
Perception ◽  
1995 ◽  
Vol 24 (12) ◽  
pp. 1373-1382 ◽  
Author(s):  
George Mather ◽  
Stuart Anstis

When a black and a white square on a grey surround exchange places, it was previously shown that on a dark surround it is the white square, and on a light surround it is the black square, that is seen in apparent motion (AM). Thus the higher-contrast square carries the AM. We now show that the same is true for second-order AM of texture-defined squares. Squares were defined by four different textures: by anisotropy (horizontal versus vertical random dashes), by alphanumeric letters, by hash marks, or by dot size. The result was that the square that differed more from the surround in texture properties carried the second-order AM. Judgments of texture salience revealed a high correlation between salience and apparent motion. In a third experiment, crossover AM between dissimilar textures was investigated, and it was found that the more salient textures carried the AM. Results cannot be explained by the concept of ‘texture activity’, but instead indicate that the system extracts a measure of ‘texture contrast’ prior to analysis of salience and apparent motion.


1999 ◽  
Vol 39 (10) ◽  
pp. 1795-1802 ◽  
Author(s):  
George Mather ◽  
Linda Murdoch

Author(s):  
W. L. Bell

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.


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