Time-resolved photoluminescence spectroscopy of Er-implanted porous silicon

1997 ◽  
Vol 71 (1) ◽  
pp. 13-20 ◽  
Author(s):  
X. Wu ◽  
R. White ◽  
U. Hömmerich ◽  
F. Namavar ◽  
A.M. Cremins-Costa
2009 ◽  
Vol 94 (18) ◽  
pp. 183101 ◽  
Author(s):  
C. H. Lin ◽  
H. S. Lin ◽  
C. C. Huang ◽  
S. K. Su ◽  
S. D. Lin ◽  
...  

2020 ◽  
pp. 000370282096970
Author(s):  
Kacper Grodecki ◽  
Krzysztof Murawski

In this article, a new data treatment based on time-resolved photoluminescence is presented. It works as a streak camera for infrared. A time-resolved photoluminescence spectrum for the HgCd0.33Te0.67 sample at 120 K was performed and analyzed. Typical time-resolved photoluminescence measurements, to compare our results with literature, were conducted. An interpretation of the behavior for three different time constants found in the signal is proposed.


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