Experimental observations of the thermal stability of high-k gate dielectric materials on silicon

2002 ◽  
Vol 303 (1) ◽  
pp. 54-63 ◽  
Author(s):  
P.S. Lysaght ◽  
P.J. Chen ◽  
R. Bergmann ◽  
T. Messina ◽  
R.W. Murto ◽  
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Young Dae Cho ◽  
Sun Wook Kim ◽  
Dae-Hong Ko ◽  
Yongshik Lee ◽  
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2011 ◽  
Vol 88 (7) ◽  
pp. 1408-1411 ◽  
Author(s):  
E. Amat ◽  
R. Rodríguez ◽  
M.B. González ◽  
J. Martín-Martínez ◽  
M. Nafría ◽  
...  

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