ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
Improved thermal stability of Al2O3/HfO2/Al2O3 high-k gate dielectric stack on GaAs
Applied Physics Letters
◽
10.1063/1.3377915
◽
2010
◽
Vol 96
(14)
◽
pp. 142112
◽
Cited By ~ 49
Author(s):
Dong Chan Suh
◽
Young Dae Cho
◽
Sun Wook Kim
◽
Dae-Hong Ko
◽
Yongshik Lee
◽
...
Keyword(s):
Thermal Stability
◽
Gate Dielectric
◽
High K
◽
Thermal Stability Of
◽
High K Gate Dielectric
Download Full-text
Related Documents
Cited By
References
Experimental observations of the thermal stability of high-k gate dielectric materials on silicon
Journal of Non-Crystalline Solids
◽
10.1016/s0022-3093(02)00964-x
◽
2002
◽
Vol 303
(1)
◽
pp. 54-63
◽
Cited By ~ 54
Author(s):
P.S. Lysaght
◽
P.J. Chen
◽
R. Bergmann
◽
T. Messina
◽
R.W. Murto
◽
...
Keyword(s):
Thermal Stability
◽
Gate Dielectric
◽
Dielectric Materials
◽
High K
◽
Thermal Stability Of
◽
High K Gate Dielectric
Download Full-text
Thermal stability and electrical properties of Zr silicate films for high-k gate-dielectric applications, as prepared by pulsed laser deposition
Applied Physics A
◽
10.1007/s00339-003-2187-4
◽
2005
◽
Vol 80
(2)
◽
pp. 321-324
◽
Cited By ~ 7
Author(s):
J. Zhu
◽
Z.G. Liu
◽
M. Zhu
◽
G.L. Yuan
◽
J.M. Liu
Keyword(s):
Thermal Stability
◽
Electrical Properties
◽
Pulsed Laser Deposition
◽
Gate Dielectric
◽
Pulsed Laser
◽
Laser Deposition
◽
High K
◽
High K Gate Dielectric
Download Full-text
Thermal Stability and Electrical Properties of High-k Gate Dielectric Materials
2006 International Workshop on Junction Technology
◽
10.1109/iwjt.2006.1669482
◽
2006
◽
Author(s):
A.P. Huang
◽
P.K. Chu
◽
P.K. Chu
Keyword(s):
Thermal Stability
◽
Electrical Properties
◽
Gate Dielectric
◽
Dielectric Materials
◽
High K
◽
High K Gate Dielectric
Download Full-text
Thermal Stability and Electrical Properties of High-k Gate Dielectric Materials
2006 International Workshop on Junction Technology
◽
10.1109/iwjt.2006.220895
◽
2006
◽
Author(s):
A.P. Huang
◽
P.K. Chu
Keyword(s):
Thermal Stability
◽
Electrical Properties
◽
Gate Dielectric
◽
Dielectric Materials
◽
High K
◽
High K Gate Dielectric
Download Full-text
Improved thermal stability and electrical properties of atomic layer deposited HfO2/AlN high-k gate dielectric stacks on GaAs
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films
◽
10.1116/1.4903367
◽
2015
◽
Vol 33
(1)
◽
pp. 01A136
◽
Cited By ~ 4
Author(s):
Yan-Qiang Cao
◽
Xin Li
◽
Lin Zhu
◽
Zheng-Yi Cao
◽
Di Wu
◽
...
Keyword(s):
Thermal Stability
◽
Electrical Properties
◽
Gate Dielectric
◽
Atomic Layer
◽
High K
◽
High K Gate Dielectric
Download Full-text
Thermal stability and electrical properties of pulsed laser deposited Hf–aluminate thin films for high-k gate dielectric applications
Journal of Physics D Applied Physics
◽
10.1088/0022-3727/38/3/014
◽
2005
◽
Vol 38
(3)
◽
pp. 446-450
◽
Cited By ~ 10
Author(s):
J Zhu
◽
Z G Liu
◽
Y R Li
Keyword(s):
Thin Films
◽
Thermal Stability
◽
Electrical Properties
◽
Gate Dielectric
◽
Pulsed Laser
◽
High K
◽
High K Gate Dielectric
Download Full-text
Thermal stability and electrical properties of titanium-aluminum oxide ultrathin films as high-k gate dielectric materials
Journal of Applied Physics
◽
10.1063/1.2432401
◽
2007
◽
Vol 101
(3)
◽
pp. 034102
◽
Cited By ~ 23
Author(s):
L. Shi
◽
Y. D. Xia
◽
B. Xu
◽
J. Yin
◽
Z. G. Liu
Keyword(s):
Thermal Stability
◽
Electrical Properties
◽
Aluminum Oxide
◽
Ultrathin Films
◽
Gate Dielectric
◽
Dielectric Materials
◽
High K
◽
Titanium Aluminum
◽
High K Gate Dielectric
Download Full-text
Thermal stability of high-k Er-silicate gate dielectric formed by interfacial reaction between Er and SiO2 films
Materials Science in Semiconductor Processing
◽
10.1016/j.mssp.2009.06.001
◽
2008
◽
Vol 11
(4)
◽
pp. 122-125
◽
Cited By ~ 3
Author(s):
Sung-Yong Chang
◽
Myeong-Il Jeong
◽
S.V. Jagadeesh Chandra
◽
Yong-Boo Lee
◽
Hyo-Bong Hong
◽
...
Keyword(s):
Thermal Stability
◽
Interfacial Reaction
◽
Gate Dielectric
◽
Sio2 Films
◽
High K
◽
Thermal Stability Of
Download Full-text
The impact of high-k gate dielectric on Junctionless Vertical Double Gate MOSFET
International Journal of Computer Sciences and Engineering
◽
10.26438/ijcse/v6i6.14751478
◽
2018
◽
Vol 6
(6)
◽
pp. 1475-1478
Author(s):
Jagdeep Rahul
Keyword(s):
Gate Dielectric
◽
Double Gate
◽
High K
◽
Double Gate Mosfet
◽
The Impact
◽
High K Gate Dielectric
Download Full-text
Development of High-K Gate Dielectric Materials
Journal of Inorganic Materials
◽
10.3724/sp.j.1077.2008.00865
◽
2008
◽
Vol 23
(5)
◽
pp. 865-871
◽
Cited By ~ 2
Author(s):
De-Qi WU
Keyword(s):
Gate Dielectric
◽
Dielectric Materials
◽
High K
◽
High K Gate Dielectric
Download Full-text
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close