Application of the ZBA-10 electron-beam exposure system in the production of precision photomasks with pattern element dimensions in the submicron range
2009 ◽
Vol 27
(6)
◽
pp. 2518
◽
1987 ◽
Vol 5
(1)
◽
pp. 47
◽
1978 ◽
A multiple-electron-beam exposure system for high-throughput, direct-write submicrometer lithography
1981 ◽
Vol 28
(11)
◽
pp. 1422-1428
◽