Excitation site-specific ion desorption study of Si() surfaces fluorinated by XeF2 using photoelectron photoion coincidence spectroscopy
2005 ◽
Vol 144-147
◽
pp. 461-463
◽
Keyword(s):
2011 ◽
Vol 184
(1-2)
◽
pp. 5-9
◽
Keyword(s):
2000 ◽
Vol 451
(1-3)
◽
pp. 143-152
◽
Keyword(s):
2006 ◽
Vol 431
(4-6)
◽
pp. 253-256
◽
2008 ◽
Vol 129
(20)
◽
pp. 204309
◽
2016 ◽
Vol 120
(50)
◽
pp. 9907-9915
◽
Keyword(s):