A simple method to determine the optical constants and thicknesses of ZnxCd1−xS thin films

1996 ◽  
Vol 289 (1-2) ◽  
pp. 238-241 ◽  
Author(s):  
J Torres ◽  
J.I Cisneros ◽  
G Gordillo ◽  
F Alvarez
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Simple Method

A SIMPLE MODEL FOR OBTAINING OPTICAL CONSTANTS OF POROUS SILICON

2001 ◽  
Vol 15 (17n19) ◽  
pp. 745-748
Author(s):  
JAIME TORRES ◽  
JAIRO GIRALDO
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Simple Model ◽  
Porous Silicon ◽  
Optical Constants ◽  
Normal Incidence ◽  
Sample Thickness ◽  
Infinite Dimensions ◽  
Simple Method ◽  
Harmonic Oscillator Model

A simple method is proposed to calculate optical constants from porous silicon (PS) thin films, out of the simulation of normal incidence reflection spectrums. In the optical system used in this model, PS one considers as a homogeneous uniform thin film when deposited upon a substrate with semi-infinite dimensions. The PS and Substrate refractive indexes are obtained using the Simple Harmonic Oscillator Model, proposed by Wemple and DiDomenico. In addition, the absorption coefficient and sample thickness are also be obtained. The model to calculate the optical constants of some samples prepared at different anodisation times is used.

DETERMINATION OF THE OPTICAL CONSTANTS AND THICKNESS OF SEMITRANSPARENT THIN FILMS USING SUCCESSIVE INTERFERENCE FRINGES OF TRANSMISSION SPECTRA

2005 ◽  
Vol 12 (03) ◽  
pp. 425-431 ◽  
Author(s):  
F. E. GHODSI
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Optical Parameters ◽  
Transmission Spectra ◽  
Simple Method ◽  
Interference Fringes ◽  
True Values ◽  
Better Than ◽  
Good Agreement

A simple method for determination of optical constants and thickness of semitransparent thin films deposited onto a transparent finite substrate has been developed. The method is based on the analysis of successive interference fringes of transmission spectra created by the films. It is essentially not necessary to obtain the envelope of transmission spectra in this method. The determined values of optical parameters are in good agreement with their true values used to generate transmission data. The accuracy of method in determining refractive index and thickness of the films is better than 1%.

Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

2003 ◽  
Vol 38 (9) ◽  
pp. 773-778 ◽  
Author(s):  
B. Karunagaran ◽  
R. T. Rajendra Kumar ◽  
C. Viswanathan ◽  
D. Mangalaraj ◽  
Sa. K. Narayandass ◽  
...  
Keyword(s):  
Thin Films ◽  
Titanium Dioxide ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Titanium Dioxide Thin Films

Optical constants of Sn-doped amorphous Ge-As-Te thin films and their physical characterization

2020 ◽  
Vol 583 ◽  
pp. 412066 ◽  
Author(s):  
Imed Boukhris ◽  
Imen Kebaili ◽  
Sami Znaidia ◽  
R. Neffati ◽  
H.H. Hegazy ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Physical Characterization

New Focusing Reflectometer for Measuring Optical Constants of Thin Films

1971 ◽  
Vol 10 (2) ◽  
pp. 342 ◽  
Author(s):  
R. E. Burge ◽  
A. T. Davidson ◽  
J. C. Draper ◽  
G. R. Field ◽  
E. Murphy
Keyword(s):  
Thin Films ◽  
Optical Constants

Effect of Sn substitution for Se on dispersive optical constants of amorphous Se–Te–Sn thin films

2017 ◽  
pp. 1-9 ◽  
Author(s):  
M. A. Dabban ◽  
Nema M. Abdelazim ◽  
Alaa M. Abd-Elnaiem ◽  
S. Mustafa ◽  
M. A. Abdel-Rahim
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Sn Substitution

Optical constants measurement of single-layer thin films on transparent substrates

1998 ◽  
Vol 158 (1-6) ◽  
pp. 221-230 ◽  
Author(s):  
A. Penzkofer ◽  
E. Drotleff ◽  
W. Holzer
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Single Layer
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