DETERMINATION OF THE OPTICAL CONSTANTS AND THICKNESS OF SEMITRANSPARENT THIN FILMS USING SUCCESSIVE INTERFERENCE FRINGES OF TRANSMISSION SPECTRA

A simple method for determination of optical constants and thickness of semitransparent thin films deposited onto a transparent finite substrate has been developed. The method is based on the analysis of successive interference fringes of transmission spectra created by the films. It is essentially not necessary to obtain the envelope of transmission spectra in this method. The determined values of optical parameters are in good agreement with their true values used to generate transmission data. The accuracy of method in determining refractive index and thickness of the films is better than 1%.

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Simple method for the determination of optical parameters of inhomogeneous thin films

Thin Solid Films ◽

10.1016/s0040-6090(98)01483-7 ◽

1999 ◽

Vol 342 (1-2) ◽

pp. 153-159 ◽

Cited By ~ 11

Author(s):

Liberato De Caro ◽

Maria Cristina Ferrara

Keyword(s):

Thin Films ◽

Optical Parameters ◽

Simple Method

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Determination of the thickness and optical constants of thin films from transmission spectra

Thin Solid Films ◽

10.1016/s0040-6090(96)08737-8 ◽

1996 ◽

Vol 286 (1-2) ◽

pp. 164-169 ◽

Cited By ~ 31

Author(s):

M Kubinyi ◽

N Benkö ◽

A Grofcsik ◽

W.Jeremy Jones

Keyword(s):

Thin Films ◽

Optical Constants ◽

Transmission Spectra

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Determination of the optical constants of thin films by means of transmission spectra and curve fitting

10.1117/12.865723 ◽

2010 ◽

Author(s):

Hongzhi Jia ◽

Huancai Lu ◽

Jianhua Peng

Keyword(s):

Thin Films ◽

Curve Fitting ◽

Optical Constants ◽

Transmission Spectra ◽

Means Of Transmission

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Determination of the optical constants of HfO2–SiO2 composite thin films through reverse fitting of transmission spectra

Vacuum ◽

10.1016/j.vacuum.2011.09.002 ◽

2011 ◽

Vol 86 (4) ◽

pp. 422-428 ◽

Cited By ~ 14

Author(s):

N.M. Kamble ◽

R.B. Tokas ◽

A. Biswas ◽

S. Thakur ◽

D. Bhattacharyya ◽

...

Keyword(s):

Thin Films ◽

Optical Constants ◽

Transmission Spectra ◽

Composite Thin Films

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Optical Constant Determination of Thin Polymer Films in the Infrared

Applied Spectroscopy ◽

10.1366/0003702854248539 ◽

1985 ◽

Vol 39 (3) ◽

pp. 405-408 ◽

Cited By ~ 70

Author(s):

R. T. Graf ◽

J. L. Koenig ◽

H. Ishida

Keyword(s):

Refractive Index ◽

Optical Constant ◽

Infrared Region ◽

Transmission Spectra ◽

Thin Polymer Films ◽

Interference Fringes ◽

Constant Determination ◽

Thin Polymer ◽

Good Agreement

Thin films of poly(vinyl chloride), poly(methyl methacrylate), and poly(styrene) were analyzed by Fourier transform infrared spectroscopy. The interference fringes present in the transmission spectra of these samples were used to determine film thickness and average refractive index. Subsequent Kramers-Kronig analysis of these transmission spectra provided the dispersion of the refractive index and the absorption index across the entire mid-infrared region. Interference fringes were absent in the optical constant spectra, and good agreement was obtained between our optical constant spectra and those of other authors.

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Determination of optical constants and thickness of Nb 2 O 5 optical films from normal incidence transmission spectra

10.1117/12.674262 ◽

2006 ◽

Cited By ~ 6

Author(s):

Limei Lin ◽

Fachun Lai ◽

Zhiago Huang ◽

Yan Qu ◽

Rongquan Gai

Keyword(s):

Optical Constants ◽

Normal Incidence ◽

Transmission Spectra ◽

Optical Films

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Effects Of Dispersion On The Determination Of Optical Constants Of Thin Films

10.1117/12.938373 ◽

1986 ◽

Cited By ~ 4

Author(s):

C K. Carniglia

Keyword(s):

Thin Films ◽

Optical Constants

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Determination of the Optical Constants of Thin Films Using Photoacoustic Spectroscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.20.l665 ◽

1981 ◽

Vol 20 (9) ◽

pp. L665-L668 ◽

Cited By ~ 31

Author(s):

Satoshi Yamasaki ◽

Hideyo Okushi ◽

Akihisa Matsuda ◽

Hidetoshi Oheda ◽

Nobuhiro Hata ◽

...

Keyword(s):

Thin Films ◽

Photoacoustic Spectroscopy ◽

Optical Constants

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Determination of optical constants of polymeric thin films by integrated optical techniques

Optics Communications ◽

10.1016/0030-4018(76)90157-7 ◽

1976 ◽

Vol 18 (3) ◽

pp. 387-390 ◽

Cited By ~ 39

Author(s):

J.D. Swalen ◽

M. Tacke ◽

R. Santo ◽

J. Fischer

Keyword(s):

Thin Films ◽

Optical Constants ◽

Optical Techniques ◽

Polymeric Thin Films ◽

Integrated Optical

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Simple Method for Estimating the Contribution of Neighbouring n-beam Interactions to Two-beam Structure Factors

Australian Journal of Physics ◽

10.1071/ph880469 ◽

1988 ◽

Vol 41 (3) ◽

pp. 469

Author(s):

HJ Juretschke ◽

HK Wagenfeld

Keyword(s):

Experimental Determination ◽

Structure Factor ◽

Beam Structure ◽

Simple Method ◽

Experimental Configuration ◽

Structure Factors ◽

Special Cases ◽

Better Than

Unless special precautions are taken, the experimental determination of two-beam structure factors to better than 1 % may include contributions from neighbouring n-beam interactions. In any particular experimental configuration, corrections for such contributions are easily carried out using the modified two-beam structure factor formalism developed recently (Juretschke 1984), once the full indexing of the pertinent n-beam interactions is known. The method is illustrated for both weak and strong primary reflections and its applicability in special cases, as well as for less than perfect crystals, is discussed.

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