Non-destructive characterization and evaluation of thin films by laser-induced ultrasonic surface waves

1996 ◽  
Vol 290-291 ◽  
pp. 305-311 ◽  
Author(s):  
D. Schneider ◽  
M.D. Tucker
1993 ◽  
Vol 224 (2) ◽  
pp. 177-183 ◽  
Author(s):  
Dieter Schneider ◽  
Thomas Schwarz ◽  
Hans-Peter Buchkremer ◽  
Detlev Stöver

1985 ◽  
Vol 54 ◽  
Author(s):  
Stephen R. Forrest ◽  
Martin L. Kaplan ◽  
Paul H. Schmidt

ABSTRACTRectifying junctions prepared by vacuum deposition of 3,4,9,10-perylenetetracarboxylic dianhydride (PTCDA) and related compounds on both p- and n-type inorganic semiconducting wafers are used for their non-destructive evaluation. By evaporation of metal contact pads onto the organic layer, we can probe many of the fundamental -bulk and surface properties of the semiconductor.


2011 ◽  
Vol 82 (6) ◽  
pp. 064905 ◽  
Author(s):  
Julien Deboucq ◽  
Marc Duquennoy ◽  
Mohammadi Ouaftouh ◽  
Frédéric Jenot ◽  
Julien Carlier ◽  
...  

1998 ◽  
Vol 315 (1-2) ◽  
pp. 29-34 ◽  
Author(s):  
R. Küchler ◽  
E. Richter

1994 ◽  
Vol 146 (2) ◽  
pp. 659-667 ◽  
Author(s):  
R. Küchler ◽  
E. Richter

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