Ion-beam analysis of phospholipid thin films deposited on c-Si

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/s0168-583x(99)00521-2 ◽

1999 ◽

Vol 159 (1-2) ◽

pp. 67-74 ◽

Author(s):

T. Som ◽

T.K. Khan ◽

P. Gupta-Bhaya ◽

S. Kumar ◽

V.N. Kulkarni

Keyword(s):

Ion Beam ◽

Ion Beam Analysis ◽

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Oxygen uptake of InN thin films as determined by ion beam analysis

Thin Solid Films ◽

10.1016/j.tsf.2006.09.021 ◽

2007 ◽

Vol 515 (7-8) ◽

pp. 3736-3739 ◽

Author(s):

S.M. Durbin ◽

P.A. Anderson ◽

A. Markwitz ◽

J. Kennedy

Keyword(s):

Oxygen Uptake ◽

Ion Beam ◽

Ion Beam Analysis ◽

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Ion beam analysis of interface reactions in magnetite and maghemite thin films

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/s0168-583x(99)00701-6 ◽

2000 ◽

Vol 161-163 ◽

pp. 510-514 ◽

Author(s):

S Thevuthasan ◽

D.E McCready ◽

W Jiang ◽

S.I Yi ◽

S Maheswaran ◽

...

Keyword(s):

Ion Beam ◽

Ion Beam Analysis ◽

Interface Reactions ◽

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Degradation of polystyrene thin films under d, 4He and 12C irradiation studied by ion beam analysis: effects of energy loss, sample thickness and isotopic content

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(95)00549-8 ◽

1995 ◽

Vol 105 (1-4) ◽

pp. 86-90 ◽

Author(s):

F. Abel ◽

V. Quillet ◽

M. Schott

Keyword(s):

Energy Loss ◽

Ion Beam ◽

Sample Thickness ◽

Ion Beam Analysis ◽

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Ion beam analysis of silver thin films on cobalt silicides

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2004.01.184 ◽

2004 ◽

Vol 219-220 ◽

pp. 897-901 ◽

Author(s):

T.L. Alford ◽

M.M. Mitan ◽

R. Govindasamy ◽

J.W. Mayer

Keyword(s):

Ion Beam ◽

Ion Beam Analysis ◽

Beam Analysis ◽

Silver Thin Films ◽

Cobalt Silicides

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Ion beam analysis of composition and impurities in YBa2Cu3O7−δ and Bi2Sr2Ca2Cu3O10−δ superconductor thin films

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/s0168-583x(99)00820-4 ◽

2000 ◽

Vol 161-163 ◽

pp. 595-599 ◽

Author(s):

Noriaki Matsunami ◽

K Endo ◽

H Sakai ◽

Y Takai

Keyword(s):

Ion Beam ◽

Ion Beam Analysis ◽

Beam Analysis ◽

Superconductor Thin Films

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Application of ion beam analysis to the selective sublimation processing of thin films for gas sensing

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2006.04.016 ◽

2006 ◽

Vol 249 (1-2) ◽

pp. 302-305

Author(s):

A. Vomiero ◽

C. Scian ◽

G. Della Mea ◽

V. Guidi ◽

G. Martinelli ◽

...

Keyword(s):

Gas Sensing ◽

Ion Beam ◽

Ion Beam Analysis ◽

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Ion beam analysis of rare earth nitride thin films

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2008.01.052 ◽

2008 ◽

Vol 266 (8) ◽

pp. 1558-1561 ◽

Author(s):

J. Kennedy ◽

S. Granville ◽

A. Markwitz ◽

B.J. Ruck ◽

H.J. Trodahl

Keyword(s):

Ion Beam ◽

Ion Beam Analysis ◽

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Ion Beam Analysis Of Nitrogen Incorporated Ultrananocrystalline Diamond (UNCD) Thin Films

10.1063/1.3586100 ◽

2011 ◽

Author(s):

S. AlFaify ◽

E. Garratt ◽

A. Dissanayake ◽

D. C. Mancini ◽

A. Kayani ◽

...

Keyword(s):

Ion Beam ◽

Ion Beam Analysis ◽

Ultrananocrystalline Diamond ◽

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Ion beam analysis of rough thin films

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/s0168-583x(02)00689-4 ◽

2002 ◽

Vol 194 (2) ◽

pp. 177-186 ◽

Author(s):

M. Mayer

Keyword(s):

Ion Beam ◽

Ion Beam Analysis ◽

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Ion beam analysis of thin films

Vacuum ◽

10.1016/0042-207x(85)90386-0 ◽

1985 ◽

Vol 35 (10-11) ◽

pp. 513

Author(s):

CJ Sofield ◽

JA Cookson

Keyword(s):

Ion Beam ◽

Ion Beam Analysis ◽

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