Synthesis and Properties of Electrically Conductive/Nitrogen Grain Boundaries Incorporated Ultrananocrystalline Diamond (N-UNCD) Thin Films Grown by Microwave Plasma Chemical Vapor Deposition (MPCVD)

Research and development have been performed to investigate the effect of total pressure and microwave power on the electrical conductivity of nitrogen (N) atoms’ grain boundaries incorporated ultrananocrystalline diamond (N-UNCD) films grown by microwave plasma chemical vapor deposition (MPCVD). Insertion of N atoms into the UNCD film’s grain boundaries induces N atoms chemical reaction with C-atoms dangling bonds, resulting in release of electrons, which induce electrical conductivity. Four-point probe electrical measurements show that the highest electrically conductive N-UNCD films, produced until now, exhibit electrical resistivity of ~1 Ohm.cm, which is orders of magnitude lower than the ≥106 Ohm.cm for undoped ultrananocrystalline diamond (UNCD) films. X-ray diffraction analysis and Raman spectroscopy revealed that the growth of the N-UNCD films by MPCVD do not produce graphite phase but only crystalline nanodiamond grains. X-ray photoelectron spectroscopy (XPS) analysis confirmed the presence of nitrogen (N) in the N-UNCD films and the high conductivity (no electrical charging is observed during XPS analysis) shown in electrical measurements.

Size-Dependent Electrical Transport Properties in Conducting Diamond Nanostripes

With the advances in nanofabrication technology, horizontally aligned and well-defined nitrogen-doped ultrananocrystalline diamond nanostripes can be fabricated with widths in the order of tens of nanometers. The study of the size-dependent electron transport properties of these nanostructures is crucial to novel electronic and electrochemical applications. In this paper, 100 nm thick n-type ultrananocrystalline diamond thin films were synthesized by microwave plasma-enhanced chemical vapor deposition method with 5% N2 gas in the plasma during the growth process. Then the nanostripes were fabricated using standard electron beam lithography and reactive ion etching techniques. The electrical transport properties of the free-standing single nanostripes of different widths from 75 to 150 nm and lengths from 1 to 128 μm were investigated. The study showed that the electrical resistivity of the n-type ultrananocrystalline diamond nanostripes increased dramatically with the decrease in the nanostripe width. The nanostripe resistivity was nearly doubted when the width was reduced from 150 nm to 75 nm. The size-dependent variability in conductivity could originate from the imposed diffusive scattering of the nanostripe surfaces which had a further compounding effect to reinforce the grain boundary scattering.