Characterization of actinide targets by low solid-angle alpha particle counting

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/s0168-9002(99)00669-5 ◽

1999 ◽

Vol 438 (1) ◽

pp. 124-130 ◽

Author(s):

B. Denecke ◽

R. Eykens ◽

J. Pauwels ◽

P. Robouch ◽

D.M. Gilliam ◽

...

Keyword(s):

Alpha Particle ◽

Solid Angle ◽

Particle Counting ◽

Angle Alpha ◽

Actinide Targets

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An algorithm for the solid angle calculation applied in alpha-particle counting

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/s0168-9002(03)01070-2 ◽

2003 ◽

Vol 505 (1-2) ◽

pp. 286-289 ◽

Author(s):

S. Pommé ◽

L. Johansson ◽

G. Sibbens ◽

B. Denecke

Keyword(s):

Alpha Particle ◽

Solid Angle ◽

Particle Counting ◽

Angle Calculation

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Standardisation of low-activity actinide solutions by alpha-particle counting at a defined solid angle

Applied Radiation and Isotopes ◽

10.1016/j.apradiso.2004.03.015 ◽

2004 ◽

Vol 61 (2-3) ◽

pp. 405-408 ◽

Author(s):

G Sibbens ◽

S Pommé ◽

T Altzitzoglou

Keyword(s):

Alpha Particle ◽

Solid Angle ◽

Particle Counting ◽

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Design of an alpha-particle counting system at a defined solid angle at Turkish atomic energy authority-Sarayköy nuclear research and training center (TAEK-SANAEM)

Radiation Physics and Chemistry ◽

10.1016/j.radphyschem.2015.08.007 ◽

2015 ◽

Vol 117 ◽

pp. 135-139 ◽

Author(s):

Meryem Seferinoğlu ◽

Emin Yeltepe

Keyword(s):

Alpha Particle ◽

Solid Angle ◽

Nuclear Research ◽

Atomic Energy ◽

Training Center ◽

Counting System ◽

Particle Counting ◽

Atomic Energy Authority ◽

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Improvements in the characterization of actinide targets by low solid-angle counting

Journal of Radioanalytical and Nuclear Chemistry ◽

10.1007/s10967-013-2647-z ◽

2013 ◽

Vol 299 (2) ◽

pp. 1061-1065 ◽

Author(s):

David M. Gilliam ◽

Andrew T. Yue

Keyword(s):

Solid Angle ◽

Actinide Targets

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Preparation and characterization of the first triscyclopentadienyl lanthanoid complexes containing two aliphatic nitrile ligands: Crystal and molecular structures of the isomorphous compounds Trans-bis(acetonitrile)tris(η5cyclopentadienyl)lanthanoid(III) (Ln = La, Ce, Pr). A successful confirmation of the solid ‘solid angle sum rule’

Inorganica Chimica Acta ◽

10.1016/s0020-1693(00)88306-1 ◽

1985 ◽

Vol 100 (1) ◽

pp. 183-199 ◽

Author(s):

Li Xing-Fu ◽

Stefan Eggers ◽

Jürgen Kopf ◽

Werner Jahn ◽

R. Dieter Fischer ◽

...

Keyword(s):

Solid Angle ◽

Molecular Structures ◽

Sum Rule ◽

Crystal And Molecular Structures ◽

Aliphatic Nitrile

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Large angle alpha particle scattering from the 3+ unnatural parity states in magnesium

Physics Letters B ◽

10.1016/0370-2693(67)90183-9 ◽

1967 ◽

Vol 25 (2) ◽

pp. 81-83 ◽

Author(s):

J.S. Vincent ◽

E.T. Boschitz ◽

J.R. Priest

Keyword(s):

Alpha Particle ◽

Large Angle ◽

Particle Scattering ◽

Unnatural Parity ◽

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Precision Alpha-Particle Counting

Nature ◽

10.1038/173991a0 ◽

1954 ◽

Vol 173 (4412) ◽

pp. 991-992 ◽

Author(s):

K. M. GLOVER ◽

G. R. HALL

Keyword(s):

Alpha Particle ◽

Particle Counting

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Characterization of Neutron- and Alpha-Particle-Induced Transients Leading to Soft Errors in 90-nm CMOS Technology

IEEE Transactions on Device and Materials Reliability ◽

10.1109/tdmr.2009.2020912 ◽

2009 ◽

Vol 9 (2) ◽

pp. 325-333 ◽

Author(s):

B. Narasimham ◽

M.J. Gadlage ◽

B.L. Bhuva ◽

R.D. Schrimpf ◽

L.W. Massengill ◽

...

Keyword(s):

Alpha Particle ◽

Soft Errors ◽

Cmos Technology

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Electrical characterization of deep levels created by bombarding nitrogen-doped 4H-SiC with alpha-particle irradiation

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2015.09.084 ◽

2016 ◽

Vol 371 ◽

pp. 312-316 ◽

Author(s):

Ezekiel Omotoso ◽

Walter E. Meyer ◽

F. Danie Auret ◽

Alexander T. Paradzah ◽

Matshisa J. Legodi

Keyword(s):

Alpha Particle ◽

Electrical Characterization ◽

Deep Levels ◽

Nitrogen Doped ◽

Particle Irradiation

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Characterization of thin Si1On surface layers on Si by proton and alpha particle backscattering

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(92)96080-i ◽

1992 ◽

Vol 68 (1-4) ◽

pp. 223-226 ◽

Author(s):

V. Havránek ◽

V. Hnatowicz ◽

J. Kvítek ◽

I. Obrusník ◽

V. Rybka ◽

...

Keyword(s):

Alpha Particle ◽

Surface Layers ◽

Particle Backscattering

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