Application of Weibull distribution analysis to the dielectric failure of multilayer ceramic capacitors

1997 ◽  
Vol 47 (3) ◽  
pp. 197-203 ◽  
Author(s):  
Y. Wang ◽  
Y.C. Chan ◽  
Z.L. Gui ◽  
D.P. Webb ◽  
L.T. Li
2013 ◽  
Vol 102 (14) ◽  
pp. 142904 ◽  
Author(s):  
Keng-Ren Lin ◽  
Chih-Han Chang ◽  
Cheng-Hung Chiang ◽  
Che-Hsin Lin

2019 ◽  
Vol 39 (4) ◽  
pp. 1178-1185 ◽  
Author(s):  
J.M. Ingman ◽  
J.P.A. Jormanainen ◽  
A.M. Vulli ◽  
J.D. Ingman ◽  
K. Maula ◽  
...  

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