Valve packing tests leakage measurement equipment sensitivity

2003 ◽  
Vol 2003 (10) ◽  
pp. 16 ◽  
2011 ◽  
Vol 131 (8) ◽  
pp. 641-647
Author(s):  
Tatsuya Furukawa ◽  
Hideaki Itoh ◽  
Toshiyuki Hori ◽  
Hisao Fukumoto ◽  
Hiroshi Wakuya ◽  
...  

2021 ◽  
Author(s):  
Bin Cai ◽  
Eric Laugeman ◽  
HsinLu Hsu ◽  
Olga Green ◽  
Nels Knutson ◽  
...  

2018 ◽  
Vol 25 (3) ◽  
pp. 686-705 ◽  
Author(s):  
M. Calvi ◽  
C. Camenzuli ◽  
R. Ganter ◽  
N. Sammut ◽  
Th. Schmidt

Within the SwissFEL project at the Paul Scherrer Institute (PSI), the hard X-ray line (Aramis) has been equipped with short-period in-vacuum undulators, known as the U15 series. The undulator design has been developed within the institute itself, while the prototyping and the series production have been implemented through a close collaboration with a Swiss industrial partner, Max Daetwyler AG, and several subcontractors. The magnetic measurement system has been built at PSI, together with all the data analysis tools. The Hall probe has been designed for PSI by the Swiss company SENIS. In this paper the general concepts of both the mechanical and the magnetic properties of the U15 series of undulators are presented. A description of the magnetic measurement equipment is given and the results of the magnetic measurement campaign are reported. Lastly, the data reduction methods and the associated models are presented and their actual implementation in the control system is detailed.


2022 ◽  
Vol 18 (1) ◽  
pp. 1-13
Author(s):  
David Thompson ◽  
Haibo Wang

This work presents a methodology to monitor the power signature of IoT devices for detecting operation abnormality. It does not require bulky measurement equipment thanks to the proposed power signature generation circuit which can be integrated into LDO voltage regulators. The proposed circuit is implemented using a 130 nm CMOS technology and simulated with power trace measured from a wireless sensor. It shows the generated power signature accurately reflects the power consumption and can be used to distinguish different operation conditions, such as wireless transmission levels, data sampling rates and microcontroller UART communications.


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