Quantitative EPMA using Bootstrap Methods

2012 ◽  
Vol 18 (S2) ◽  
pp. 1020-1021
Author(s):  
J. Davis ◽  
J. Scott

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Author(s):  
G.F. Bastin ◽  
H.J.M. Heijligers

Among the ultra-light elements B, C, N, and O nitrogen is the most difficult element to deal with in the electron probe microanalyzer. This is mainly caused by the severe absorption that N-Kα radiation suffers in carbon which is abundantly present in the detection system (lead-stearate crystal, carbonaceous counter window). As a result the peak-to-background ratios for N-Kα measured with a conventional lead-stearate crystal can attain values well below unity in many binary nitrides . An additional complication can be caused by the presence of interfering higher-order reflections from the metal partner in the nitride specimen; notorious examples are elements such as Zr and Nb. In nitrides containing these elements is is virtually impossible to carry out an accurate background subtraction which becomes increasingly important with lower and lower peak-to-background ratios. The use of a synthetic multilayer crystal such as W/Si (2d-spacing 59.8 Å) can bring significant improvements in terms of both higher peak count rates as well as a strong suppression of higher-order reflections.


Animals ◽  
2021 ◽  
Vol 11 (5) ◽  
pp. 1445
Author(s):  
Mauro Giammarino ◽  
Silvana Mattiello ◽  
Monica Battini ◽  
Piero Quatto ◽  
Luca Maria Battaglini ◽  
...  

This study focuses on the problem of assessing inter-observer reliability (IOR) in the case of dichotomous categorical animal-based welfare indicators and the presence of two observers. Based on observations obtained from Animal Welfare Indicators (AWIN) project surveys conducted on nine dairy goat farms, and using udder asymmetry as an indicator, we compared the performance of the most popular agreement indexes available in the literature: Scott’s π, Cohen’s k, kPABAK, Holsti’s H, Krippendorff’s α, Hubert’s Γ, Janson and Vegelius’ J, Bangdiwala’s B, Andrés and Marzo’s ∆, and Gwet’s γ(AC1). Confidence intervals were calculated using closed formulas of variance estimates for π, k, kPABAK, H, α, Γ, J, ∆, and γ(AC1), while the bootstrap and exact bootstrap methods were used for all the indexes. All the indexes and closed formulas of variance estimates were calculated using Microsoft Excel. The bootstrap method was performed with R software, while the exact bootstrap method was performed with SAS software. k, π, and α exhibited a paradoxical behavior, showing unacceptably low values even in the presence of very high concordance rates. B and γ(AC1) showed values very close to the concordance rate, independently of its value. Both bootstrap and exact bootstrap methods turned out to be simpler compared to the implementation of closed variance formulas and provided effective confidence intervals for all the considered indexes. The best approach for measuring IOR in these cases is the use of B or γ(AC1), with bootstrap or exact bootstrap methods for confidence interval calculation.


1999 ◽  
Vol 5 (S2) ◽  
pp. 78-79
Author(s):  
C. Merlet ◽  
X. Llovet ◽  
F. Salvat

Studies of x-ray emission from thin films on substrates using an electron probe microanalyzer (EPMA) provide useful information on the characteristics of x-ray generation by electron beams. In this study, EPMA measurements of multilayered samples were performed in order to test and improve analytical and numerical models used for quantitative EPMA. These models provide relatively accurate results for samples consisting of layers with similar average atomic numbers, because of their similar properties regarding electron transport and x-ray generation. On the contrary, these models find difficulties to describe the process when the various layers have very different atomic numbers. In a previous work, we studied the surface ionization of thin copper films of various thicknesses deposited on substrates with very different atomic numbers. In the present communication, the study is extended to the case of multilayered specimens.The studied specimens consisted of thin copper films deposited on a carbon layer which, in turn, was placed on a variety of single-element substrates, ranging from Be to Bi.


1994 ◽  
Vol 89 (428) ◽  
pp. 1282-1289 ◽  
Author(s):  
James G. Booth ◽  
Ronald W. Butler ◽  
Peter Hall

2007 ◽  
Vol 24 (4) ◽  
pp. 10-19 ◽  
Author(s):  
Abdefihak Zoubir ◽  
D. Iskandler
Keyword(s):  

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