Robust and fast near-field antenna measurement technique

2016 ◽  
Vol 8 (4-5) ◽  
pp. 777-784 ◽  
Author(s):  
Po-Jui Chiu ◽  
Wei-Chung Cheng ◽  
Dong-Chen Tsai ◽  
Zuo-Min Tsai

Traditional near-field antenna measurements use the sampling theorem to reconstruct the antenna pattern perfectly. However, a large number of measurement points are required for this approach. To address this problem, in this study, we propose a technique to accelerate the near-field antenna measurement, which is achieved by sparse E-field sampling in the region where the E-field changes smoothly and dense sampling in the region where the field changes rapidly. Further, our approach ensures robustness of measurement; the E-field information need not be known before carrying out measurements. Our experimental results demonstrate that our technique can reduce the number of measuring points by at least 64.9% when measuring two different patterns (15-GHz horn antenna with θ = 0° and 10°).

1996 ◽  
Vol 44 (7) ◽  
pp. 1049-1051 ◽  
Author(s):  
R.G. Yaccarino ◽  
L.I. Williams ◽  
Y. Rahmat-Samii

Author(s):  
Jeff Dunnihoo ◽  
Pasi Tamminen ◽  
Toni Viheriäkoski

Abstract In this study we present a novel method to use a field collapse method together with fully automated near field scanning equipment to construct E- and H-field information of a system during transient ESD events. This inexpensive method provides an alternative way for system designers to validate and analyze the EMC/ESD capability of electronic systems without TLP pulsers, ESD simulators, or precision inductive current probes.


Sign in / Sign up

Export Citation Format

Share Document