Overview of diagnostics and instrumentation for National Synchrotron Light Source II

2010 ◽  
Vol 1 (MEDSI-6) ◽  
Author(s):  
B. Kosciuk ◽  
A. Blednykh ◽  
D. Padrazo ◽  
O. Singh

National Synchrotron Light Source II (NSLS-II), a new state-of-the-art third-generation light source under construction at Brookhaven National Laboratory is expected to have extremely small emittance and extraordinary beam stability. The mechanical requirements for beam diagnostics and instrumentation are exceptionally challenging. Here we present an overview of the mechanical aspects of some NSLS-II diagnostics as well as the performance levels of some systems currently under development.

2010 ◽  
Vol 1 (MEDSI-6) ◽  
Author(s):  
B. Kosciuk ◽  
V. Ravindranath ◽  
O. Singh ◽  
S. Sharma

The National Synchrotron Light Source II currently under construction at the Brookhaven National Laboratory is expected to provide unprecedented orbit stability in the storage ring in order to fully utilize the very small emittance of the electron beam. The desire to measure the position of such small beams to high resolution imposes stringent requirements on the thermal and structural stability of the supports for the beam postion monitor (BPM) pick-up electrodes located on multi-pole vacuum chambers and more so on those located upstream and downstream of insertion device sources where the beam size is the smallest. Even with tunnel air temperature expected to be controlled to ±0.1°C, low coefficient of thermal expansion materials is required to meet this level of thermal stability. Here, we present the application of these materials to the design of stable supports for radio frequency (RF)-BPMs as well as the methods of testing their performance.


2004 ◽  
Vol 17 (5) ◽  
pp. 13-29
Author(s):  
Laura Mgrdichian ◽  
Arhonda Gogos ◽  
Peter W. Stephens ◽  
Lawrence Shapiro ◽  
D. Peter Siddons ◽  
...  

2011 ◽  
Vol 1 (MEDSI-6) ◽  
Author(s):  
S. Sharma ◽  
A. Broadbent ◽  
L. Doom ◽  
M. Fallier ◽  
H. C. Hseuh ◽  
...  

National Synchrotron Light Source (NSLS-II) is a new 3 GeV, 500 mA, high-brightness synchrotron light source facility being built at the Brookhaven National Laboratory. Approved for construction in January 2009, the NSLS-II project is expected to be completed in June 2014. In this paper we discuss the present status of the mechanical design and construction of some major components of this facility, namely (i) conventional facilities, (ii) injector complex (iii) storage ring, (iv) RF system and (v) beamlines.


2017 ◽  
Vol 24 (5) ◽  
pp. 919-924 ◽  
Author(s):  
Toshiya Tanabe ◽  
Harmanpreet Bassan ◽  
Andrew Broadbent ◽  
Peter Cappadoro ◽  
John Escallier ◽  
...  

The National Synchrotron Light Source (NSLS) ceased operation in September 2014 and was succeeded by NSLS-II. There were four in-vacuum undulators (IVUs) in operation at NSLS. The most recently constructed IVU for NSLS was the mini-gap undulator (MGU-X25, to be renamed IVU18 for NSLS-II), which was constructed in 2006. This device was selected to be reused for the New York Structural Biology Consortium Microdiffraction beamline at NSLS-II. At the time of construction, IVU18 was a state-of-the-art undulator designed to be operated as a cryogenic permanent-magnet undulator. Due to the more stringent field quality and impedance requirements of the NSLS-II ring, the transition region was redesigned. The control system was also updated to NSLS-II specifications. This paper reports the details of the IVU18 refurbishment activities including additional magnetic measurement and tuning.


2002 ◽  
Vol 09 (01) ◽  
pp. 185-191 ◽  
Author(s):  
C. JACOBSEN ◽  
T. BEETZ ◽  
M. FESER ◽  
A. OSANNA ◽  
A. STEIN ◽  
...  

Soft X-ray microscopy allows one to study nanoscale heterogeneities in dry and wet environmental science, biological, polymer, and geochemical specimens. Recent advances in instrumentation at the X-1A beamline at the National Synchrotron Light Source at Brookhaven National Laboratory are described. Spectromicroscopy data analysis methods including component mapping and principal component analysis (PCA) are then discussed.


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