Dependence of interface widths on ion bombardment conditions in secondary ion mass spectrometric analysis of a nickel/chromium multilayer structure

1987 ◽  
Vol 59 (11) ◽  
pp. 1518-1529 ◽  
Author(s):  
Monique. Moens ◽  
Fred C. Adams ◽  
David S. Simons
Keyword(s):  
Multilayer Structure ◽  
Ion Bombardment ◽  
Mass Spectrometric ◽  
Mass Spectrometric Analysis ◽  
Spectrometric Analysis ◽  
Nickel Chromium ◽  
Secondary Ion

Mechanisms of Dopant Depth Profile Modification During Mass Spectrometric Analysis of Multilayer Structure

2015 ◽  
Vol 60 (6) ◽  
pp. 511-520 ◽  
Author(s):  
A.A. Efremov ◽  
◽  
V.G. Litovchenko ◽  
V.P. Melnik ◽  
O.S. Oberemok ◽  
...  
Keyword(s):  
Depth Profile ◽  
Multilayer Structure ◽  
Mass Spectrometric ◽  
Mass Spectrometric Analysis ◽  
Spectrometric Analysis ◽  
Profile Modification

Evaluation of the local thermal equilibrium model for quantitative secondary ion mass spectrometric analysis

1976 ◽  
Vol 48 (9) ◽  
pp. 1341-1348 ◽  
Author(s):  
David S. Simons ◽  
Judith E. Baker ◽  
Charles A. Evans
Keyword(s):  
Equilibrium Model ◽  
Thermal Equilibrium ◽  
Mass Spectrometric ◽  
Mass Spectrometric Analysis ◽  
Local Thermal Equilibrium ◽  
Spectrometric Analysis ◽  
Secondary Ion

252Cf-plasma desorption and cesium-ion liquid secondary-ion mass spectrometric analysis of recombinant proteins

1991 ◽  
Vol 5 (2) ◽  
pp. 81-85 ◽  
Author(s):  
A. Tsarbopoulos ◽  
B. N. Pramanik ◽  
P. Reichert ◽  
M. M. Siegel ◽  
T. L. Nagabhushan ◽  
...  
Keyword(s):  
Recombinant Proteins ◽  
Mass Spectrometric ◽  
Mass Spectrometric Analysis ◽  
Spectrometric Analysis ◽  
Plasma Desorption ◽  
Cesium Ion ◽  
Secondary Ion

Secondary ion mass spectrometric analysis of leaching behaviour of magnesium from chrysotile in oxalic acid solution

1984 ◽  
Vol 6 (6) ◽  
pp. 286-290 ◽  
Author(s):  
J. A. Verlinden ◽  
J. K. De Waele ◽  
I. M. Swenters ◽  
F. C. Adams
Keyword(s):  
Oxalic Acid ◽  
Acid Solution ◽  
Oxalic Acid Solution ◽  
Mass Spectrometric ◽  
Mass Spectrometric Analysis ◽  
Spectrometric Analysis ◽  
Leaching Behaviour ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometric analysis of polymer surfaces and additives

1993 ◽  
Vol 20 (12) ◽  
pp. 991-999 ◽  
Author(s):  
R. W. Linton ◽  
M. P. Mawn ◽  
A. M. Belu ◽  
J. M. DeSimone ◽  
M. O. Hunt ◽  
...  
Keyword(s):  
Time Of Flight ◽  
Mass Spectrometric ◽  
Mass Spectrometric Analysis ◽  
Polymer Surfaces ◽  
Spectrometric Analysis ◽  
Secondary Ion

Secondary ion mass spectrometric analysis of polymer and coal surfaces for trace inorganic elements

1984 ◽  
Vol 56 (8) ◽  
pp. 1519-1521 ◽  
Author(s):  
N. S. McIntyre ◽  
W. J. Chauvin ◽  
R. R. Martin
Keyword(s):  
Mass Spectrometric ◽  
Mass Spectrometric Analysis ◽  
Spectrometric Analysis ◽  
Inorganic Elements ◽  
Secondary Ion

Collision target-gas effects during the tandem secondary-ion mass-spectrometric analysis of polymers

1990 ◽  
Vol 86 (10) ◽  
pp. 1863 ◽  
Author(s):  
Graham J. Leggett ◽  
David Briggs ◽  
John C. Vickerman
Keyword(s):  
Mass Spectrometric ◽  
Mass Spectrometric Analysis ◽  
Spectrometric Analysis ◽  
Secondary Ion ◽  
Collision Target
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