Dependence of interface widths on ion bombardment conditions in secondary ion mass spectrometric analysis of a nickel/chromium multilayer structure

1987 ◽  
Vol 59 (11) ◽  
pp. 1518-1529 ◽  
Author(s):  
Monique. Moens ◽  
Fred C. Adams ◽  
David S. Simons
Keyword(s):  
Multilayer Structure ◽  
Ion Bombardment ◽  
Mass Spectrometric ◽  
Mass Spectrometric Analysis ◽  
Spectrometric Analysis ◽  
Nickel Chromium ◽  
Secondary Ion

Mechanisms of Dopant Depth Profile Modification During Mass Spectrometric Analysis of Multilayer Structure

2015 ◽  
Vol 60 (6) ◽  
pp. 511-520 ◽  
Author(s):  
A.A. Efremov ◽  
◽  
V.G. Litovchenko ◽  
V.P. Melnik ◽  
O.S. Oberemok ◽  
...  
Keyword(s):  
Depth Profile ◽  
Multilayer Structure ◽  
Mass Spectrometric ◽  
Mass Spectrometric Analysis ◽  
Spectrometric Analysis ◽  
Profile Modification

252Cf-plasma desorption and cesium-ion liquid secondary-ion mass spectrometric analysis of recombinant proteins

1991 ◽  
Vol 5 (2) ◽  
pp. 81-85 ◽  
Author(s):  
A. Tsarbopoulos ◽  
B. N. Pramanik ◽  
P. Reichert ◽  
M. M. Siegel ◽  
T. L. Nagabhushan ◽  
...  
Keyword(s):  
Recombinant Proteins ◽  
Mass Spectrometric ◽  
Mass Spectrometric Analysis ◽  
Spectrometric Analysis ◽  
Plasma Desorption ◽  
Cesium Ion ◽  
Secondary Ion

Time-of-flight secondary ion mass spectrometric analysis of polymer surfaces and additives

1993 ◽  
Vol 20 (12) ◽  
pp. 991-999 ◽  
Author(s):  
R. W. Linton ◽  
M. P. Mawn ◽  
A. M. Belu ◽  
J. M. DeSimone ◽  
M. O. Hunt ◽  
...  
Keyword(s):  
Time Of Flight ◽  
Mass Spectrometric ◽  
Mass Spectrometric Analysis ◽  
Polymer Surfaces ◽  
Spectrometric Analysis ◽  
Secondary Ion
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