Numerical Simulation of Scanning Electrochemical Microscopy Experiments with Frame-Shaped Integrated Atomic Force Microscopy−SECM Probes Using the Boundary Element Method
2009 ◽
Vol 40
(3)
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pp. 581-592
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2004 ◽
Vol 108
(39)
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pp. 15117-15127
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2013 ◽
Vol 7
(6)
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pp. 406-409
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Applications of the Boundary Element Method in Electrochemistry: Scanning Electrochemical Microscopy
1999 ◽
Vol 103
(21)
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pp. 4387-4392
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2007 ◽
Vol 53
(2)
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pp. 555-560
◽
1999 ◽
Vol 103
(21)
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pp. 4393-4398
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