Nanoscale mapping of catalytic hotspots on Fe, N-modified HOPG by scanning electrochemical microscopy-atomic force microscopy

Nanoscale ◽  
2018 ◽  
Vol 10 (15) ◽  
pp. 6962-6970 ◽  
Author(s):  
Srikanth Kolagatla ◽  
Palaniappan Subramanian ◽  
Alex Schechter
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Modification ◽  
High Resolution ◽  
Scanning Electrochemical Microscopy ◽  
Graphitic Carbon ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Microscopy

The scanning electrochemical microscopy-atomic force microscopy (SECM-AFM) technique is used to map catalytic currents post Fe and N surface modification of graphitic carbon with an ultra-high resolution of 50 nm.

Nanowire Probes for High Resolution Combined Scanning Electrochemical Microscopy − Atomic Force Microscopy

Nano Letters ◽  
2005 ◽  
Vol 5 (4) ◽  
pp. 639-643 ◽  
Author(s):  
David P. Burt ◽  
Neil R. Wilson ◽  
John M. R. Weaver ◽  
Phillip S. Dobson ◽  
Julie V. Macpherson
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Scanning Electrochemical Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Microscopy

An L-shaped nanoprobe for scanning electrochemical microscopy-atomic force microscopy

2013 ◽  
Vol 7 (6) ◽  
pp. 406-409 ◽  
Author(s):  
Eunjoo Lee ◽  
Minseo Kim ◽  
Jungwoo Seong ◽  
Heungjoo Shin ◽  
Geunbae Lim
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Electrochemical Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Microscopy

scholarly journals Scanning Electrochemical Microscopy-Atomic Force Microscopy Probes from Pyrolyzed Parylene C

2013 ◽  
Vol 19 (S2) ◽  
pp. 46-47
Author(s):  
K.C. Morton ◽  
M.A. Derylo ◽  
A.E. Weber ◽  
L.A. Baker
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Electrochemical Microscopy ◽  
Parylene C ◽  
Force Microscopy ◽  
Atomic Force ◽  
Electrochemical Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Comparison study of live cells by atomic force microscopy, confocal microscopy, and scanning electrochemical microscopy

2007 ◽  
Vol 85 (3) ◽  
pp. 175-183 ◽  
Author(s):  
Xiaocui Zhao ◽  
Nils O Petersen ◽  
Zhifeng Ding
Keyword(s):  
Atomic Force Microscopy ◽  
Confocal Microscopy ◽  
Scanning Electrochemical Microscopy ◽  
Time Lapse ◽  
Live Cells ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tapping Mode Afm ◽  
Electrochemical Microscopy

In this report, three kinds of scanning probe microscopy techniques, atomic force microscopy (AFM), confocal microscopy (CM), and scanning electrochemical microscopy (SECM), were used to study live cells in the physiological environment. Two model cell lines, CV-1 and COS-7, were studied. Time-lapse images were obtained with both contact and tapping mode AFM techniques. Cells were more easily scratched or moved by contact mode AFM than by tapping mode AFM. Detailed surface structures such as filamentous structures on the cell membrane can be obtained and easily discerned with tapping mode AFM. The toxicity of ferrocenemethanol (Fc) on live cells was studied by CM in reflection mode by recording the time-lapse images of controlled live cells and live cells with different Fc concentrations. No significant change in the morphology of cells was caused by Fc. Cells were imaged by SECM with Fc as the mediator at a biased potential of 0.35 V (vs. Ag/AgCl with a saturated KCl solution). Cells did not change visibly within 1 h, which indicated that SECM was a noninvasive technique and thus has a unique advantage for the study of soft cells, since the electrode scanned above the cells instead of in contact with them. Reactive oxygen species (ROS) generated by the cells were detected and images based on these chemical species were obtained. It is demonstrated that SECM can provide not only the topographical images but also the images related to the chemical or biochemical species released by the live cells.Key words: live cells, atomic force microscopy, confocal microscopy, scanning electrochemical microscopy.

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