scholarly journals Locating the Frequency of Turnover in Thin-Film Diffusion Impedance

Author(s):  
Mathijs Janssen ◽  
Juan Bisquert
Author(s):  
Y. Kuru ◽  
J. Chakraborty ◽  
U. Welzel ◽  
M. Wohlschlögel ◽  
Eric J. Mittemeijer

1988 ◽  
Vol 164 ◽  
pp. 417-428 ◽  
Author(s):  
N. Kumar ◽  
K. Pourrezaei ◽  
B. Lee ◽  
E.C. Douglas

1988 ◽  
Vol 158 (1) ◽  
pp. 45-50 ◽  
Author(s):  
Hwa-Yueh Yang ◽  
X.-A. Zhao ◽  
M.-A. Nicolet

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