scholarly journals Reliable Multivalued Conductance States in TaOx Memristors through Oxygen Plasma-Assisted Electrode Deposition with in Situ-Biased Conductance State Transmission Electron Microscopy Analysis

2018 ◽  
Vol 10 (35) ◽  
pp. 29757-29765 ◽  
Author(s):  
Myoung-Jae Lee ◽  
Gyeong-Su Park ◽  
David H. Seo ◽  
Sung Min Kwon ◽  
Hyeon-Jun Lee ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Oxygen Plasma ◽  
Transmission Electron Microscopy Analysis ◽  
Transmission Electron ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis ◽  
State Transmission ◽  
Conductance States ◽  
Conductance State

scholarly journals In Situ Transmission Electron Microscopy Analysis of Copper–Germanium Nanowire Solid-State Reaction

Nano Letters ◽  
2019 ◽  
Vol 19 (12) ◽  
pp. 8365-8371 ◽  
Author(s):  
Khalil El hajraoui ◽  
Eric Robin ◽  
Clemens Zeiner ◽  
Alois Lugstein ◽  
Stéphanie Kodjikian ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Solid State ◽  
Solid State Reaction ◽  
Transmission Electron Microscopy Analysis ◽  
Transmission Electron ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis

scholarly journals In Situ Transmission Electron Microscopy Analysis of Aluminum–Germanium Nanowire Solid-State Reaction

Nano Letters ◽  
2019 ◽  
Vol 19 (5) ◽  
pp. 2897-2904 ◽  
Author(s):  
Khalil El hajraoui ◽  
Minh Anh Luong ◽  
Eric Robin ◽  
Florian Brunbauer ◽  
Clemens Zeiner ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Solid State ◽  
Solid State Reaction ◽  
Transmission Electron Microscopy Analysis ◽  
Transmission Electron ◽  
Electron Microscopy Analysis ◽  
Microscopy Analysis
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