Optical Models for the Characterization of Silica Nanosphere Monolayers Prepared by the Langmuir−Blodgett Method Using Ellipsometry in the Quasistatic Regime
1999 ◽
Vol 339
(1-2)
◽
pp. 277-283
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Keyword(s):
2005 ◽
Vol 38
(8)
◽
pp. 664-670
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1995 ◽
Vol 261
(1-2)
◽
pp. 287-295
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Keyword(s):
2006 ◽
Vol 05
(02n03)
◽
pp. 199-205
Keyword(s):