scholarly journals On the reliability of powder diffraction Line Profile Analysis of plastically deformed nanocrystalline systems

2016 ◽  
Vol 6 (1) ◽  
Author(s):  
Luca Rebuffi ◽  
Andrea Troian ◽  
Regina Ciancio ◽  
Elvio Carlino ◽  
Amine Amimi ◽  
...  
Keyword(s):  
Line Profile ◽  
Powder Diffraction ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
Diffraction Line Profile

Full Pattern Methods for the Analysis of Plastically Deformed Materials

2007 ◽  
Vol 130 ◽  
pp. 27-32 ◽  
Author(s):  
Paolo Scardi ◽  
Matteo Leoni ◽  
Mirco D'Incau
Keyword(s):  
Plastic Deformation ◽  
Line Profile ◽  
Powder Diffraction ◽  
Science Studies ◽  
Materials Science ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Specific Reference ◽  
Line Profile Analysis ◽  
Diffraction Line Profile

The recent evolution of powder diffraction line profile analysis toward full pattern methods is discussed. Specific reference is made to the Whole Powder Pattern Modelling (WPPM), as applied to metals and ceramics subjected to strong plastic deformation. Examples concerning three different materials science studies are shown to illustrate features and potentialities of the WPPM approach.

scholarly journals X-ray diffraction line profile analysis for defect study in Zr-2.5% Nb material

2004 ◽  
Vol 27 (1) ◽  
pp. 59-67 ◽  
Author(s):  
K. Kapoor ◽  
D. Lahiri ◽  
S. V. R. Rao ◽  
T. Sanyal ◽  
B. P. Kashyap
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile

Stacking Disorder in Aurivillius Compounds Studied by X-Ray Diffraction Line Profile Analysis

2001 ◽  
Vol 378-381 ◽  
pp. 753-758
Author(s):  
Alexandre Boulle ◽  
C. Legrand ◽  
P. Thomas ◽  
R. Guinebretière ◽  
J.P. Mercurio ◽  
...  
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Stacking Disorder
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