Surface-enhanced IR–visible sum frequency generation vibrational spectroscopy

2009 ◽  
Vol 11 (18) ◽  
pp. 3436 ◽  
Author(s):  
Qifeng Li ◽  
Chiung Wen Kuo ◽  
Zheng Yang ◽  
Peilin Chen ◽  
Keng C. Chou
Keyword(s):  
Vibrational Spectroscopy ◽  
Sum Frequency Generation ◽  
Sum Frequency ◽  
Surface Enhanced ◽  
Frequency Generation

Sum Frequency Generation Vibrational Spectroscopy of 1,3-Butadiene Hydrogenation on 4 nm Pt@SiO2, Pd@SiO2, and Rh@SiO2 Core–Shell Catalysts

Nano Letters ◽  
2014 ◽  
Vol 15 (1) ◽  
pp. 39-44 ◽  
Author(s):  
James M. Krier ◽  
William D. Michalak ◽  
Xiaojun Cai ◽  
Lindsay Carl ◽  
Kyriakos Komvopoulos ◽  
...  
Keyword(s):  
Vibrational Spectroscopy ◽  
Sum Frequency Generation ◽  
Core Shell ◽  
Sum Frequency ◽  
Frequency Generation ◽  
Butadiene Hydrogenation

Study of FeOx/Au inverse model catalysts by in situ sum frequency generation vibrational spectroscopy

2009 ◽  
Vol 96 (2) ◽  
pp. 345-356 ◽  
Author(s):  
Orsolya Hakkel ◽  
Zoltán Pászti ◽  
Tamás Keszthelyi ◽  
Krisztina Frey ◽  
László Guczi
Keyword(s):  
Vibrational Spectroscopy ◽  
Sum Frequency Generation ◽  
Inverse Model ◽  
Model Catalysts ◽  
Sum Frequency ◽  
Frequency Generation

A Theoretical Investigation of Surface‐enhanced Sum‐frequency Generation

2015 ◽  
Vol 63 (1) ◽  
pp. 136-144 ◽  
Author(s):  
Y. L. Yeh ◽  
J. Lei ◽  
S. Y. Chen ◽  
A. H. H. Chang ◽  
C. K. Lin ◽  
...  
Keyword(s):  
Theoretical Investigation ◽  
Sum Frequency Generation ◽  
Sum Frequency ◽  
Surface Enhanced ◽  
Frequency Generation

scholarly journals Surface-specific vibrational spectroscopy of the water/silica interface: screening and interference

2017 ◽  
Vol 19 (25) ◽  
pp. 16875-16880 ◽  
Author(s):  
Jan Schaefer ◽  
Grazia Gonella ◽  
Mischa Bonn ◽  
Ellen H. G. Backus
Keyword(s):  
Molecular Structure ◽  
Vibrational Spectroscopy ◽  
Sum Frequency Generation ◽  
Sum Frequency ◽  
Sum Frequency Generation Spectroscopy ◽  
Frequency Generation

Surface-specific vibrational sum-frequency generation spectroscopy (V-SFG) is used to obtain information about the molecular structure at charged interfaces.

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