scholarly journals Reconstructing accurate ToF-SIMS depth profiles for organic materials with differential sputter rates

The Analyst ◽  
2015 ◽  
Vol 140 (17) ◽  
pp. 6005-6014 ◽  
Author(s):  
Adam J. Taylor ◽  
Daniel J. Graham ◽  
David G. Castner
Keyword(s):  
Polymer Films ◽  
Organic Materials ◽  
Depth Profiles ◽  
New Methods ◽  
Tof Sims

This study describes new methods to transform and correct ToF-SIMS depth profiles of multilayer polymer films exhibiting differential sputter rates.

Preparation of (TiTe2)x(Sb2Te3)y(TiTe2)3(Bi2Te3)z Superlattices using the Modulated Elemental Reactants (MER) Technique

2005 ◽  
Vol 886 ◽  
Author(s):  
Clay Mortensen ◽  
Ben Matelich ◽  
Benjamin Schmid ◽  
Raimar Rostek ◽  
David C. Johnson
Keyword(s):  
Annealing Temperature ◽  
Unit Cell ◽  
Good Reproducibility ◽  
Cell Control ◽  
Depth Profiles ◽  
Modulated Elemental Reactants ◽  
Tof Sims ◽  
Elemental Reactants

AbstractDifficulty in preparing (Bi2Te3)x(Sb2Te3)y superlattices due to interdiffusion of Sb and Bi led to the study of interduffusion barriers. TiTe2 has been explored as an interdiffusion barrier to minimize the interdiffusion of Sb and Bi, as TiTe2 is not soluble in either Bi2Te3 or Sb2Te3. Preparation of (TiTe2)3(Sb2Te3)y(TiTe2)3(Bi2Te3)z superlattices has been achieved with varying x, y and z. The formation of the superlattices was studied as a function of annealing temperature and time. TOF-SIMS depth profiles were used to study the extent of interdiffusion in the samples. Unit cell control was achieved allowing for the preparation of an array of superlattices with varying periods with very good reproducibility.

ToF-SIMS depth profiles on Argon-implanted amorphous carbon. Damage effect and hydrogen characterization

2016 ◽  
Vol 48 (7) ◽  
pp. 428-431 ◽  
Author(s):  
Salvatore Grasso ◽  
Francesco Fumagalli ◽  
Marialuisa Polignano ◽  
Enrica Ravizza ◽  
Simona Spadoni ◽  
...  
Keyword(s):  
Amorphous Carbon ◽  
Damage Effect ◽  
Depth Profiles ◽  
Tof Sims

Multivariate characterization of ultra-thin nanofunctional plasma polymer films using ToF-SIMS analysis

2004 ◽  
Vol 36 (8) ◽  
pp. 1114-1118 ◽  
Author(s):  
M. von Gradowski ◽  
M. Wahl ◽  
R. Förch ◽  
H. Hilgers
Keyword(s):  
Polymer Films ◽  
Plasma Polymer ◽  
Tof Sims ◽  
Sims Analysis
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