Depth Profiling Analysis of Organic Materials by Using ToF-SIMS and Gradient Shaving Preparation

2009 ◽  
Vol 15 (3) ◽  
pp. 235-238 ◽  
Author(s):  
Hiroto Itoh
Keyword(s):  
Organic Materials ◽  
Depth Profiling ◽  
Tof Sims ◽  
Profiling Analysis

scholarly journals Analysis of Thin Film Specimens Using ToF-SIMS Wedge Protocol, A Comparison with Depth Profiling

2021 ◽  
Vol 27 (S1) ◽  
pp. 1564-1565
Author(s):  
Vincent Smentkowski ◽  
Shubhodeep Goswami ◽  
Felix Kollmer ◽  
Julia Zakel ◽  
Henrik Arlinghaus ◽  
...  
Keyword(s):  
Thin Film ◽  
Depth Profiling ◽  
Tof Sims

SIMS depth profiling analysis of P-doped n-type Si layer to develop the Si QD solar cell

2014 ◽  
Vol 46 (S1) ◽  
pp. 341-343
Author(s):  
Tae Woon Kim ◽  
Hyun Jeong Baek ◽  
Jong Shik Jang ◽  
Seung Mi Lee ◽  
Kyung Joong Kim
Keyword(s):  
Solar Cell ◽  
Depth Profiling ◽  
Profiling Analysis ◽  
Sims Depth Profiling

scholarly journals Measurement of Ion Sputtering Yields for In-depth Profiling Analysis

1991 ◽  
Vol 77 (12) ◽  
pp. 2171-2178 ◽  
Author(s):  
Toshiko SUZUKI ◽  
Kichinosuke HIROKAWA ◽  
Yasuo FUKUDA ◽  
Kenichi SUZUKI ◽  
Satoshi HASHIMOTO ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Ion Sputtering ◽  
Sputtering Yields ◽  
Profiling Analysis

Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials

2007 ◽  
Vol 39 (4) ◽  
pp. 294-298 ◽  
Author(s):  
A. G. Shard ◽  
P. J. Brewer ◽  
F. M. Green ◽  
I. S. Gilmore
Keyword(s):  
Organic Materials ◽  
Depth Profiling ◽  
Sputtering Yields ◽  
Sims Depth Profiling

Depth Profiling of Organic Light-Emitting Diodes by ToF-SIMS Coupled with Wavelet–Principal Component Analysis

2019 ◽  
Vol 1 (7) ◽  
pp. 1821-1828 ◽  
Author(s):  
Céline Noël ◽  
Nunzio Tuccitto ◽  
Yan Busby ◽  
Manuel Auer-Berger ◽  
Antonino Licciardello ◽  
...  
Keyword(s):  
Principal Component Analysis ◽  
Light Emitting Diodes ◽  
Depth Profiling ◽  
Principal Component ◽  
Component Analysis ◽  
Organic Light Emitting Diodes ◽  
Light Emitting ◽  
Tof Sims ◽  
Organic Light

TOF-SIMS depth profiling of SIMON

2003 ◽  
Vol 203-204 ◽  
pp. 441-444
Author(s):  
Ge Xin ◽  
Gui Dong ◽  
Chen Xu ◽  
Cha Liangzhen ◽  
O. Brox ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Tof Sims ◽  
Sims Depth Profiling
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