In situ studies of catalysts under reaction conditions by total electron-yield XAS. Possibilities and limitations of a new experimental technique

Faraday Discussions ◽

10.1039/fd9960500317 ◽

1996 ◽

Vol 105 ◽

pp. 317 ◽

Cited By ~ 9

Author(s):

Sven L. M. Schroeder ◽

Geoffrey D. Moggridge ◽

Evans Chabala ◽

R. Mark Ormerod ◽

Trevor Rayment ◽

...

Keyword(s):

Experimental Technique ◽

Total Electron Yield ◽

Reaction Conditions ◽

Total Electron ◽

In Situ Studies ◽

Electron Yield

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ChemInform Abstract: In situ Studies of Catalysts under Reaction Conditions by Total Electron-yield XAS. Possibilities and Limitations of a New Experimental Technique

ChemInform ◽

10.1002/chin.199746347 ◽

2010 ◽

Vol 28 (46) ◽

pp. no-no

Author(s):

S. L. M. SCHROEDER ◽

G. D. MOGGRIDGE ◽

E. CHABALA ◽

R. M. ORMEROD ◽

T. RAYMENT ◽

...

Keyword(s):

Experimental Technique ◽

Total Electron Yield ◽

Reaction Conditions ◽

Total Electron ◽

In Situ Studies ◽

Electron Yield

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In situ probing of the near-surface properties of heterogeneous catalysts under reaction conditions: An introduction to total electron-yield XAS

Journal of Molecular Catalysis A Chemical ◽

10.1016/s1381-1169(96)00499-2 ◽

1997 ◽

Vol 119 (1-3) ◽

pp. 357-365 ◽

Cited By ~ 12

Author(s):

Sven L.M. Schroeder ◽

Geoffrey D. Moggridge ◽

Trevor Rayment ◽

Richard M. Lambert

Keyword(s):

Surface Properties ◽

Heterogeneous Catalysts ◽

Total Electron Yield ◽

Reaction Conditions ◽

Total Electron ◽

Near Surface ◽

Electron Yield

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ChemInform Abstract: In situ Probing of the Near-Surface Properties of Heterogeneous Catalysts under Reaction Conditions: An Introduction to Total Electron- yield XAS

ChemInform ◽

10.1002/chin.199732278 ◽

2010 ◽

Vol 28 (32) ◽

pp. no-no

Author(s):

S. L. M. SCHROEDER ◽

G. D. MOGGRIDGE ◽

T. RAYMENT ◽

R. M. LAMBERT

Keyword(s):

Surface Properties ◽

Heterogeneous Catalysts ◽

Total Electron Yield ◽

Reaction Conditions ◽

Total Electron ◽

Near Surface ◽

Electron Yield

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In situ total-electron-yield sulfur K-edge XAFS measurements during exposure of copper to an SO2-containing humid atmosphere

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/0168-9002(95)00134-4 ◽

1995 ◽

Vol 360 (3) ◽

pp. 634-641 ◽

Cited By ~ 12

Author(s):

Inho Song ◽

Brett Rickett ◽

Paul Janavicius ◽

Joe H Payer ◽

Mark R Antonio

Keyword(s):

Total Electron Yield ◽

Humid Atmosphere ◽

Total Electron ◽

Electron Yield

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New experimental technique: X-ray absorption spectroscopy detector for in situ studies in the soft X-ray range (250 eV ⩽ hv ⩽ 1000 eV) under reaction conditions

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/s0168-9002(98)91991-x ◽

1998 ◽

Vol 406 (2) ◽

pp. 311-322 ◽

Cited By ~ 30

Author(s):

A Knop-Gericke ◽

M Hävecker ◽

Th Neisius ◽

Th Schedel-Niedrig

Keyword(s):

Absorption Spectroscopy ◽

Experimental Technique ◽

Reaction Conditions ◽

X Ray ◽

In Situ Studies ◽

X Ray Absorption

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New experimental technique: X-ray absorption spectroscopy detector for in situ studies in the soft X-ray range (250eV?h??1000eV) under reaction conditions

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/s0168-9002(97)01155-8 ◽

1998 ◽

Vol 406 (2) ◽

pp. 311-322 ◽

Cited By ~ 1

Author(s):

A KNOPGERICKE

Keyword(s):

Absorption Spectroscopy ◽

Experimental Technique ◽

Reaction Conditions ◽

X Ray ◽

In Situ Studies ◽

X Ray Absorption

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Total Electron Yield Detector Working at Low Temperature for Linear Dichroïsm Studies on Monocrystalline Samples

Journal de Physique IV (Proceedings) ◽

10.1051/jp4/1997213 ◽

1997 ◽

Vol 7 (C2) ◽

pp. C2-325-C2-326

Author(s):

C. Revenant-Brizard ◽

J. R. Regnard ◽

J. Mimault ◽

D. Duclos ◽

J. J. Faix

Keyword(s):

Low Temperature ◽

Linear Dichroism ◽

Total Electron Yield ◽

Total Electron ◽

Electron Yield

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Surface Segregation of CaF2in Thin Si(111)/CaF2/Si Multilayers Studied by Total Electron Yield Spectroscopy andIn situEllipsometry

Japanese Journal of Applied Physics ◽

10.1143/jjap.44.5171 ◽

2005 ◽

Vol 44 (7A) ◽

pp. 5171-5177

Author(s):

Takeo Ejima ◽

Katsumi Ohuchi ◽

Makoto Watanabe

Keyword(s):

Surface Segregation ◽

Total Electron Yield ◽

Total Electron ◽

Electron Yield

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Total electron yield method in x-ray absorption spectroscopy: A closer look at the saturation/self-absorption effects (abstract)

Journal of Applied Physics ◽

10.1063/1.365534 ◽

1997 ◽

Vol 81 (8) ◽

pp. 4709-4709 ◽

Cited By ~ 7

Author(s):

V. Chakarian ◽

Y. U. Idzerda

Keyword(s):

Absorption Spectroscopy ◽

Total Electron Yield ◽

Total Electron ◽

X Ray ◽

Electron Yield ◽

X Ray Absorption

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Photon-stimulated desorption and total-electron yield fromDyBa2Cu3O7−xbetween 15–180 eV

Physical Review B ◽

10.1103/physrevb.39.6630 ◽

1989 ◽

Vol 39 (10) ◽

pp. 6630-6635 ◽

Cited By ~ 6

Author(s):

R. A. Rosenberg ◽

C.-R. Wen

Keyword(s):

Total Electron Yield ◽

Total Electron ◽

Electron Yield

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