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In situ probing of the near-surface properties of heterogeneous catalysts under reaction conditions: An introduction to total electron-yield XAS
Journal of Molecular Catalysis A Chemical
◽
10.1016/s1381-1169(96)00499-2
◽
1997
◽
Vol 119
(1-3)
◽
pp. 357-365
◽
Cited By ~ 12
Author(s):
Sven L.M. Schroeder
◽
Geoffrey D. Moggridge
◽
Trevor Rayment
◽
Richard M. Lambert
Keyword(s):
Surface Properties
◽
Heterogeneous Catalysts
◽
Total Electron Yield
◽
Reaction Conditions
◽
Total Electron
◽
Near Surface
◽
Electron Yield
Download Full-text
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Cited By
References
ChemInform Abstract: In situ Probing of the Near-Surface Properties of Heterogeneous Catalysts under Reaction Conditions: An Introduction to Total Electron- yield XAS
ChemInform
◽
10.1002/chin.199732278
◽
2010
◽
Vol 28
(32)
◽
pp. no-no
Author(s):
S. L. M. SCHROEDER
◽
G. D. MOGGRIDGE
◽
T. RAYMENT
◽
R. M. LAMBERT
Keyword(s):
Surface Properties
◽
Heterogeneous Catalysts
◽
Total Electron Yield
◽
Reaction Conditions
◽
Total Electron
◽
Near Surface
◽
Electron Yield
Download Full-text
ChemInform Abstract: In situ Studies of Catalysts under Reaction Conditions by Total Electron-yield XAS. Possibilities and Limitations of a New Experimental Technique
ChemInform
◽
10.1002/chin.199746347
◽
2010
◽
Vol 28
(46)
◽
pp. no-no
Author(s):
S. L. M. SCHROEDER
◽
G. D. MOGGRIDGE
◽
E. CHABALA
◽
R. M. ORMEROD
◽
T. RAYMENT
◽
...
Keyword(s):
Experimental Technique
◽
Total Electron Yield
◽
Reaction Conditions
◽
Total Electron
◽
In Situ Studies
◽
Electron Yield
Download Full-text
In situ studies of catalysts under reaction conditions by total electron-yield XAS. Possibilities and limitations of a new experimental technique
Faraday Discussions
◽
10.1039/fd9960500317
◽
1996
◽
Vol 105
◽
pp. 317
◽
Cited By ~ 9
Author(s):
Sven L. M. Schroeder
◽
Geoffrey D. Moggridge
◽
Evans Chabala
◽
R. Mark Ormerod
◽
Trevor Rayment
◽
...
Keyword(s):
Experimental Technique
◽
Total Electron Yield
◽
Reaction Conditions
◽
Total Electron
◽
In Situ Studies
◽
Electron Yield
Download Full-text
In situ total-electron-yield sulfur K-edge XAFS measurements during exposure of copper to an SO2-containing humid atmosphere
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment
◽
10.1016/0168-9002(95)00134-4
◽
1995
◽
Vol 360
(3)
◽
pp. 634-641
◽
Cited By ~ 12
Author(s):
Inho Song
◽
Brett Rickett
◽
Paul Janavicius
◽
Joe H Payer
◽
Mark R Antonio
Keyword(s):
Total Electron Yield
◽
Humid Atmosphere
◽
Total Electron
◽
Electron Yield
Download Full-text
Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structure
Physical Review B
◽
10.1103/physrevb.37.2450
◽
1988
◽
Vol 37
(5)
◽
pp. 2450-2464
◽
Cited By ~ 200
Author(s):
A. Erbil
◽
G. S. Cargill III
◽
R. Frahm
◽
R. F. Boehme
Keyword(s):
Fine Structure
◽
Total Electron Yield
◽
Total Electron
◽
Near Surface
◽
X Ray
◽
Absorption Fine
◽
Electron Yield
◽
X Ray Absorption
Download Full-text
Secondary electron emission spectroscopy and total electron yield measurements for the assessment of near-surface damage in diamond
Diamond and Related Materials
◽
10.1016/0925-9635(92)90143-c
◽
1992
◽
Vol 1
(5-6)
◽
pp. 440-444
◽
Cited By ~ 15
Author(s):
A. Hoffman
◽
S. Prawer
◽
R. Kalish
Keyword(s):
Electron Emission
◽
Emission Spectroscopy
◽
Secondary Electron
◽
Secondary Electron Emission
◽
Surface Damage
◽
Total Electron Yield
◽
Total Electron
◽
Near Surface
◽
Electron Yield
Download Full-text
An experimental comparison of the total-electron-yield and conversion-electron-yield modes for near-surface characterization using X-ray excitation
Journal of Electron Spectroscopy and Related Phenomena
◽
10.1016/s0368-2048(97)00081-9
◽
1997
◽
Vol 87
(1)
◽
pp. 81-89
◽
Cited By ~ 6
Author(s):
S. Zheng
◽
S. Hayakawa
◽
Y. Gohshi
Keyword(s):
Conversion Electron
◽
Surface Characterization
◽
Experimental Comparison
◽
Total Electron Yield
◽
Total Electron
◽
Near Surface
◽
X Ray
◽
Electron Yield
Download Full-text
Total Electron Yield Detector Working at Low Temperature for Linear Dichroïsm Studies on Monocrystalline Samples
Journal de Physique IV (Proceedings)
◽
10.1051/jp4/1997213
◽
1997
◽
Vol 7
(C2)
◽
pp. C2-325-C2-326
Author(s):
C. Revenant-Brizard
◽
J. R. Regnard
◽
J. Mimault
◽
D. Duclos
◽
J. J. Faix
Keyword(s):
Low Temperature
◽
Linear Dichroism
◽
Total Electron Yield
◽
Total Electron
◽
Electron Yield
Download Full-text
Surface Segregation of CaF2in Thin Si(111)/CaF2/Si Multilayers Studied by Total Electron Yield Spectroscopy andIn situEllipsometry
Japanese Journal of Applied Physics
◽
10.1143/jjap.44.5171
◽
2005
◽
Vol 44
(7A)
◽
pp. 5171-5177
Author(s):
Takeo Ejima
◽
Katsumi Ohuchi
◽
Makoto Watanabe
Keyword(s):
Surface Segregation
◽
Total Electron Yield
◽
Total Electron
◽
Electron Yield
Download Full-text
Total electron yield method in x-ray absorption spectroscopy: A closer look at the saturation/self-absorption effects (abstract)
Journal of Applied Physics
◽
10.1063/1.365534
◽
1997
◽
Vol 81
(8)
◽
pp. 4709-4709
◽
Cited By ~ 7
Author(s):
V. Chakarian
◽
Y. U. Idzerda
Keyword(s):
Absorption Spectroscopy
◽
Total Electron Yield
◽
Total Electron
◽
X Ray
◽
Electron Yield
◽
X Ray Absorption
Download Full-text
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