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Dynamic digital integrated circuit testing using oscillation-test method
Electronics Letters
◽
10.1049/el:19980529
◽
1998
◽
Vol 34
(8)
◽
pp. 762
◽
Cited By ~ 20
Author(s):
K. Arabi
◽
H. Ihs
◽
C. Dufaza
◽
B. Kaminska
Keyword(s):
Integrated Circuit
◽
Test Method
◽
Circuit Testing
◽
Integrated Circuit Testing
◽
Oscillation Test
◽
Digital Integrated Circuit
Download Full-text
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Cited By
References
Digital integrated circuit testing for art historians and test experts
IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings.
◽
10.1109/iccd.2004.1347889
◽
2004
◽
Author(s):
E. McCluskey
Keyword(s):
Integrated Circuit
◽
Circuit Testing
◽
Integrated Circuit Testing
◽
Art Historians
◽
Digital Integrated Circuit
Download Full-text
Digital integrated circuit testing using transient signal analysis
Proceedings International Test Conference 1996. Test and Design Validity
◽
10.1109/test.1996.557062
◽
2002
◽
Cited By ~ 30
Author(s):
J.F. Plusquellic
◽
D.M. Chiarulli
◽
S.P. Levitan
Keyword(s):
Integrated Circuit
◽
Signal Analysis
◽
Transient Signal
◽
Circuit Testing
◽
Integrated Circuit Testing
◽
Digital Integrated Circuit
Download Full-text
The concept of proper operation region in digital integrated circuit testing, the 8080A microprocessor as an example
Microprocessing and Microprogramming
◽
10.1016/0165-6074(83)90208-9
◽
1983
◽
Vol 12
(5)
◽
pp. 285-290
Author(s):
Bożena Kaminska
◽
Jan Zabrodzki
Keyword(s):
Integrated Circuit
◽
Circuit Testing
◽
Integrated Circuit Testing
◽
Proper Operation
◽
Digital Integrated Circuit
Download Full-text
Digital integrated circuit testing from a quality perspective
Microelectronics Journal
◽
10.1016/0026-2692(94)90115-5
◽
1994
◽
Vol 25
(2)
◽
pp. 140-141
Author(s):
Z. Nikolić
Keyword(s):
Integrated Circuit
◽
Circuit Testing
◽
Integrated Circuit Testing
◽
Digital Integrated Circuit
Download Full-text
Digital integrated circuit testing from a quality persepctive
Microelectronics Reliability
◽
10.1016/0026-2714(94)90057-4
◽
1994
◽
Vol 34
(10)
◽
pp. 1697-1698
Author(s):
Z. Nikolić
Keyword(s):
Integrated Circuit
◽
Circuit Testing
◽
Integrated Circuit Testing
◽
Digital Integrated Circuit
Download Full-text
Digital integrated circuit testing from a quality perspective
Microelectronics Reliability
◽
10.1016/0026-2714(94)90496-0
◽
1994
◽
Vol 34
(1)
◽
pp. 194-195
Author(s):
G.W.A.D.
Keyword(s):
Integrated Circuit
◽
Circuit Testing
◽
Integrated Circuit Testing
◽
Digital Integrated Circuit
Download Full-text
Integrated circuit testing at Texas Instruments Limited. Automatic testing cuts cost of quality control
Microelectronics Reliability
◽
10.1016/0026-2714(70)90602-5
◽
1970
◽
Vol 9
(2)
◽
pp. 116
Keyword(s):
Quality Control
◽
Integrated Circuit
◽
Automatic Testing
◽
Circuit Testing
◽
Cost Of Quality
◽
Integrated Circuit Testing
Download Full-text
Time-Domain Measurements for Silicon Integrated Circuit Testing Using Photoconductors
Picosecond Electronics and Optoelectronics
◽
10.1007/978-3-642-70780-3_12
◽
1985
◽
pp. 66-69
◽
Cited By ~ 1
Author(s):
W. R. Eisenstadt
◽
R. B. Hammond
◽
D. R. Bowman
◽
R. W. Dutton
Keyword(s):
Time Domain
◽
Integrated Circuit
◽
Circuit Testing
◽
Integrated Circuit Testing
Download Full-text
INTEGRATED CIRCUIT TESTING AND ANALYSIS
Handbook of Quality Integrated Circuit Manufacturing
◽
10.1016/b978-0-12-781870-2.50015-4
◽
1991
◽
pp. 415-463
Author(s):
ROBERT ZORICH
Keyword(s):
Integrated Circuit
◽
Circuit Testing
◽
Integrated Circuit Testing
Download Full-text
MIRAGE read-in integrated circuit testing results
10.1117/12.352896
◽
1999
◽
Author(s):
Theodore R. Hoelter
◽
Blake A. Henry
◽
John H. Graff
◽
Naseem Y. Aziz
Keyword(s):
Integrated Circuit
◽
Circuit Testing
◽
Integrated Circuit Testing
Download Full-text
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