Time-Domain Measurements for Silicon Integrated Circuit Testing Using Photoconductors

Picosecond Electronics and Optoelectronics ◽

10.1007/978-3-642-70780-3_12 ◽

1985 ◽

pp. 66-69 ◽

Author(s):

W. R. Eisenstadt ◽

R. B. Hammond ◽

D. R. Bowman ◽

R. W. Dutton

Keyword(s):

Time Domain ◽

Integrated Circuit ◽

Circuit Testing ◽

Integrated Circuit Testing

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Dynamic digital integrated circuit testing using oscillation-test method

Electronics Letters ◽

10.1049/el:19980529 ◽

1998 ◽

Vol 34 (8) ◽

pp. 762 ◽

Author(s):

K. Arabi ◽

H. Ihs ◽

C. Dufaza ◽

B. Kaminska

Keyword(s):

Integrated Circuit ◽

Test Method ◽

Circuit Testing ◽

Integrated Circuit Testing ◽

Oscillation Test ◽

Digital Integrated Circuit

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Integrated circuit testing at Texas Instruments Limited. Automatic testing cuts cost of quality control

Microelectronics Reliability ◽

10.1016/0026-2714(70)90602-5 ◽

1970 ◽

Vol 9 (2) ◽

pp. 116

Keyword(s):

Quality Control ◽

Integrated Circuit ◽

Automatic Testing ◽

Circuit Testing ◽

Cost Of Quality ◽

Integrated Circuit Testing

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INTEGRATED CIRCUIT TESTING AND ANALYSIS

Handbook of Quality Integrated Circuit Manufacturing ◽

10.1016/b978-0-12-781870-2.50015-4 ◽

1991 ◽

pp. 415-463

Author(s):

ROBERT ZORICH

Keyword(s):

Integrated Circuit ◽

Circuit Testing ◽

Integrated Circuit Testing

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MIRAGE read-in integrated circuit testing results

10.1117/12.352896 ◽

1999 ◽

Author(s):

Theodore R. Hoelter ◽

Blake A. Henry ◽

John H. Graff ◽

Naseem Y. Aziz

Keyword(s):

Integrated Circuit ◽

Circuit Testing ◽

Integrated Circuit Testing

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Digital integrated circuit testing for art historians and test experts

IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. ◽

10.1109/iccd.2004.1347889 ◽

2004 ◽

Author(s):

E. McCluskey

Keyword(s):

Integrated Circuit ◽

Circuit Testing ◽

Integrated Circuit Testing ◽

Art Historians ◽

Digital Integrated Circuit

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Highly Focused Ion Beams in Integrated Circuit Testing

Materials Science Forum ◽

10.4028/www.scientific.net/msf.248-249.427 ◽

1997 ◽

Vol 248-249 ◽

pp. 427-432 ◽

Author(s):

K.M. Horn ◽

P.E. Dodd ◽

B.L. Doyle

Keyword(s):

Integrated Circuit ◽

Ion Beams ◽

Focused Ion Beams ◽

Circuit Testing ◽

Integrated Circuit Testing

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GaAs Integrated Circuit Testing Using Electrooptic Sampling

10.1109/cornel.1987.721211 ◽

2005 ◽

Author(s):

K.J. Weingarten ◽

M.J.W. Rodwell ◽

D.M. Bloom

Keyword(s):

Integrated Circuit ◽

Circuit Testing ◽

Integrated Circuit Testing ◽

Electrooptic Sampling

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An Overview of Integrated Circuit Testing Methods[1]

Microelectronics Failure Analysis ◽

10.31399/asm.tb.mfadr7.t91110634 ◽

2019 ◽

pp. 634-642

Author(s):

Anne Gattiker ◽

Phil Nigh ◽

Rob Aitken

Keyword(s):

Integrated Circuit ◽

Testing Methods ◽

Circuit Testing ◽

Integrated Circuit Testing

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High-Speed Integrated Circuit Testing by Time-Resolved Photoemission

High-Speed Electronics - Springer Series in Electronics and Photonics ◽

10.1007/978-3-642-82979-6_39 ◽

1986 ◽

pp. 200-203 ◽

Author(s):

R. Clauberg ◽

H. K. Seitz ◽

A. Blacha ◽

J. A. Kash ◽

H. Beha

Keyword(s):

Integrated Circuit ◽

Circuit Testing ◽

Time Resolved ◽

Integrated Circuit Testing

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3D Knife-edge Characterization of Two-Photon Absorption Volume in Silicon for Integrated Circuit Testing

Nonlinear Optics ◽

10.1364/nlo.2011.nmd5 ◽

2011 ◽

Author(s):

K. Shao ◽

V. Pouget ◽

E. Faraud ◽

C. Larue ◽

D. McMorrow ◽

...

Keyword(s):

Integrated Circuit ◽

Photon Absorption ◽

Circuit Testing ◽

Two Photon Absorption ◽

Integrated Circuit Testing

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