RWA for mitigating power excursion effects in EDFA-based all-optical metro networks

2007 ◽  
Author(s):  
F. Cugini ◽  
P. Ghelfi ◽  
A. Bogoni ◽  
L. Valcarenghi ◽  
P. Castoldi ◽  
...  
Keyword(s):  
All Optical ◽  
Metro Networks

CST: A new contention reduction scheme in all-optical packet switched star-based metro networks

2010 ◽  
Vol 67 (5) ◽  
pp. 361-375 ◽  
Author(s):  
Akbar Ghaffar Pour Rahbar ◽  
Oliver Yang
Keyword(s):  
Reduction Scheme ◽  
All Optical ◽  
Metro Networks

scholarly journals Enabling dynamic all optical IP off-loading at Tb/s rates in large Metro Networks

2021 ◽  
Author(s):  
J. A. Hernández ◽  
M. Rapisarda ◽  
A. Gatto ◽  
P. Parolari ◽  
M. Svaluto Moreolo ◽  
...  
Keyword(s):  
All Optical ◽  
Metro Networks

Correlation analysis of radiation damage

1978 ◽  
Vol 36 (1) ◽  
pp. 214-215
Author(s):  
R. Hegerl ◽  
A. Feltynowski ◽  
B. Grill
Keyword(s):  
Electron Microscopy ◽  
Independent Random Variables ◽  
Optical Parameters ◽  
Bright Field Image ◽  
Bright Field ◽  
Expectation Value ◽  
All Optical ◽  
Image Element ◽  
Stochastic Series ◽  
The Common

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.

ALL-OPTICAL DIGITAL CIRCUITS

1988 ◽  
Vol 49 (C2) ◽  
pp. C2-459-C2-462 ◽  
Author(s):  
F. A.P. TOOLEY ◽  
B. S. WHERRETT ◽  
N. C. CRAFT ◽  
M. R. TAGHIZADEH ◽  
J. F. SNOWDON ◽  
...  
Keyword(s):  
Digital Circuits ◽  
All Optical
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