scholarly journals First on-sky demonstration of spatial Linear Dark Field Control with the vector-Apodizing Phase Plate at Subaru/SCExAO

2021 ◽  
Author(s):  
S. P. Bos ◽  
K. L. Miller ◽  
J. Lozi ◽  
O. Guyon ◽  
D. S. Doelman ◽  
...  
Keyword(s):  
Dark Field ◽  
Phase Plate ◽  
Field Control

scholarly journals Laboratory Demonstration of Spatial Linear Dark Field Control For Imaging Extrasolar Planets in Reflected Light

2020 ◽  
Vol 132 (1016) ◽  
pp. 104502
Author(s):  
Thayne Currie ◽  
Eugene Pluzhnik ◽  
Olivier Guyon ◽  
Ruslan Belikov ◽  
Kelsey Miller ◽  
...  
Keyword(s):  
Extrasolar Planets ◽  
Dark Field ◽  
Reflected Light ◽  
Field Control

scholarly journals Spatial linear dark field control and holographic modal wavefront sensing with a vAPP coronagraph on MagAO-X

2019 ◽  
Vol 5 (04) ◽  
pp. 1 ◽  
Author(s):  
Kelsey Miller ◽  
Jared R. Males ◽  
Olivier Guyon ◽  
Laird M. Close ◽  
David Doelman ◽  
...  
Keyword(s):  
Dark Field ◽  
Wavefront Sensing ◽  
Field Control

A Comparison of Calculated Images Generated by Six Modes of Transmission Electron Microscopy

1974 ◽  
Vol 32 ◽  
pp. 368-369
Author(s):  
A. Engel ◽  
J. W. Wiggins ◽  
David Woodruff
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscope ◽  
Dark Field ◽  
Phase Plate ◽  
Modes Of Transmission ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Annular Detector ◽  
Conventional Electron Microscopy

Six modes of transmission electron microscopy are compared by a numerical simulation of the image formation assuming perfectly coherent illumination and ignoring the influence of radiation damage and noise. The comparison includes five modes of conventional electron microscopy (CEM): axial bright field, Unwin's phase plate, central stop dark field, tilted-beam dark field and conical illumination dark field, and the annular detector mode of the scanning transmission electron microscope (STEM).

High Voltage Electron Phase Microscopy With Crystal Supports

1977 ◽  
Vol 35 ◽  
pp. 196-197
Author(s):  
R. L Hines
Keyword(s):  
Phase Contrast ◽  
Dark Field ◽  
Phase Plate ◽  
High Contrast ◽  
Phase Object ◽  
Bright Field ◽  
Phase Microscopy ◽  
Voltage Electron ◽  
Latex Sphere ◽  
Micron Diameter

The use of single crystal support films to produce high contrast images of phase objects has been discussed by Hines and Howie (1). When a phase object such as a biological molecule or a latex sphere is located on top of a strongly diffracting crystal support, the crystal support acts like a phase plate. Dark field, shadow or phase contrast images may be formed depending upon the exact crystal diffraction conditions and thickness. An objective aperture is used to exclude the diffracted beams so that the image is formed only with the bright field beam and the electrons scattered by the object. For simplicity in analysis, 0.11 micron diameter latex spheres are used as objects and are supported on graphite crystals about 0.1 microns thick. The graphite crystal preparation is described elsewhere (2). The latex sphere suspension is sprayed onto the graphite with a glass nebulizer after the graphite has been made hydrophilic by subjecting it to a glow discharge.

scholarly journals Spatial linear dark field control on Subaru/SCExAO. Maintaining high contrast with a vAPP coronagraph

2020 ◽  
Author(s):  
K. Miller ◽  
S. Bos ◽  
J. Lozi ◽  
O. Guyon ◽  
D. S. Doelman ◽  
...  
Keyword(s):  
Dark Field ◽  
High Contrast ◽  
Field Control

scholarly journals Laboratory Demonstration of Spatial Linear Dark-Field Control for Imaging Extrasolar Planets in Reflected Light

2020 ◽  
Author(s):  
Thayne Currie ◽  
Olivier Guyon ◽  
Eugene Pluzhnik ◽  
Ruslan Belikov ◽  
Kelsey Miller ◽  
...  
Keyword(s):  
Extrasolar Planets ◽  
Dark Field ◽  
Reflected Light ◽  
Field Control

Utilizing Dark Field Electron Microscopy to Produce Lantern Slides

1974 ◽  
Vol 32 ◽  
pp. 116-117
Author(s):  
J. N. Meador ◽  
C. N. Sun ◽  
H. J. White
Keyword(s):  
Electron Microscope ◽  
Electron Micrographs ◽  
Dark Field ◽  
Limiting Factor ◽  
Clinical Laboratories ◽  
Field Electron ◽  
Time Element ◽  
Field Electron Microscopy ◽  
Dark Field Electron ◽  
Dark Field Micrographs

The electron microscope is being utilized more and more in clinical laboratories for pathologic diagnosis. One of the major problems in the utilization of the electron microscope for diagnostic purposes is the time element involved. Recent experimentation with rapid embedding has shown that this long phase of the process can be greatly shortened. In rush cases the making of projection slides can be eliminated by taking dark field electron micrographs which show up as a positive ready for use. The major limiting factor for use of dark field micrographs is resolution. However, for conference purposes electron micrographs are usually taken at 2.500X to 8.000X. At these low magnifications the resolution obtained is quite acceptable.

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