ON THE STATISTICAL ANALYSIS OF ATOM PROBE DATA

1987 ◽  
Vol 48 (C6) ◽  
pp. C6-559-C6-564 ◽  
Author(s):  
M. G. Hetherington ◽  
M. K. Miller
1986 ◽  
Vol 47 (C7) ◽  
pp. C7-489-C7-494
Author(s):  
L. V. ALVENSLEBEN ◽  
R. GRÜNE ◽  
A. HÜTTEN ◽  
M. OEHRING

2010 ◽  
Vol 16 (S2) ◽  
pp. 1858-1859 ◽  
Author(s):  
C Parish ◽  
C Capdevila ◽  
MK Miller

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.


2011 ◽  
Vol 17 (3) ◽  
pp. 418-430 ◽  
Author(s):  
Michael R. Keenan ◽  
Vincent S. Smentkowski ◽  
Robert M. Ulfig ◽  
Edward Oltman ◽  
David J. Larson ◽  
...  

AbstractWe demonstrate for the first time that multivariate statistical analysis techniques can be applied to atom probe tomography data to estimate the chemical composition of a sample at the full spatial resolution of the atom probe in three dimensions. Whereas the raw atom probe data provide the specific identity of an atom at a precise location, the multivariate results can be interpreted in terms of the probabilities that an atom representing a particular chemical phase is situated there. When aggregated to the size scale of a single atom (∼0.2 nm), atom probe spectral-image datasets are huge and extremely sparse. In fact, the average spectrum will have somewhat less than one total count per spectrum due to imperfect detection efficiency. These conditions, under which the variance in the data is completely dominated by counting noise, test the limits of multivariate analysis, and an extensive discussion of how to extract the chemical information is presented. Efficient numerical approaches to performing principal component analysis (PCA) on these datasets, which may number hundreds of millions of individual spectra, are put forward, and it is shown that PCA can be computed in a few seconds on a typical laptop computer.


1986 ◽  
Vol 47 (C7) ◽  
pp. C7-495-C7-501 ◽  
Author(s):  
M. G. HETHERINGTON ◽  
A. CEREZO ◽  
J. HYDE ◽  
G. D.W. SMITH ◽  
G. M. WORRALL

2011 ◽  
Vol 17 (S2) ◽  
pp. 720-721
Author(s):  
M Keenan ◽  
V Smentkowski ◽  
R Ulfig ◽  
E Oltman ◽  
D Larson ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.


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