Statistical analysis of atom probe data: Detecting the early stages of solute clustering and/or co-segregation

2009 ◽  
Vol 109 (5) ◽  
pp. 502-509 ◽  
Author(s):  
J.M. Hyde ◽  
A. Cerezo ◽  
T.J. Williams
Author(s):  
Е.В. Докукина ◽  
Е.В. Парфенова

В работе исследуется один из возможных метод оценки риска дополнительных финансовых незапланированных затрат в рамках реализации проектов ракетно-космической отрасли, поскольку по различным причинам они не учитывались при определении технико-экономических показателей реализуемого перспективного проекта. Следовательно, предлагаемый метод позволяет на ранних стадиях проведения исследований оценить дополнительные затраты и учесть их влияние на конечные технико-экономические показатели перспективного проекта. Метод строится на основе статистического анализа затрат по этапам жизненного цикла и по проекту в целом. По итогам исследования сделан вывод о том, что риск дополнительных финансовых затрат может снизить эффективность проекта в полтора - три раза. The paper explores one of the possible methods for assessing the risk of additional unplanned costs for the implementation of a promising project. Under additional means costs that for some reason were not planned when determining the technical and economic indicators of the prospective project being implemented. The proposed method allows for the early stages of research to assess the additional costs and take into account their impact on the final technical and economic indicators of a promising project. The method is based on a statistical analysis of costs for the stages of the life cycle and for the project as a whole. The study concluded that the risk of additional costs may reduce the effectiveness of the project in one and a half to three times.


Author(s):  
Brian J. Galli

The purpose of this study is to examine the risks of using statistical tools in a project basis. A systematic search of certain academic databases has been conducted for this study. Statistical tools could be used in a project, and they should be properly planned and designed. Statistical tools include major activities, such as collecting and analyzing data, providing meaningful interpretation, and reporting findings. When dealing with statistical tools, there are several risks that may exist and impact the project either positively or negatively. This study covers a brief outline of the risk management, statistical tools, and the relationship between the two concepts. Finally, a discussion of the common type of risks that are initiated by using statistical analysis tools are provided, which could be planned, identified, and analyzed in the early stages of the project.


1986 ◽  
Vol 47 (C7) ◽  
pp. C7-489-C7-494
Author(s):  
L. V. ALVENSLEBEN ◽  
R. GRÜNE ◽  
A. HÜTTEN ◽  
M. OEHRING

1987 ◽  
Vol 48 (C6) ◽  
pp. C6-559-C6-564 ◽  
Author(s):  
M. G. Hetherington ◽  
M. K. Miller

1990 ◽  
Vol 186 ◽  
Author(s):  
M.G. Hetherington ◽  
J.M. Hyde ◽  
M.K. Miller

AbstractThe properties of many advanced alloys are derived from extremely fine-scale microstructures. This poses interesting questions about the measurement of composition on this scale. The phase separation of model Fe-Cr alloys has been been studied with the atom-probe. Statistical techniques have been used to estimate the composition and compare the results with the predictions of linear and non-linear theories of spinodal decomposition and the distributions obtained from Monte-Carlo calculations.


2006 ◽  
Vol 8 (12) ◽  
pp. 1202-1205 ◽  
Author(s):  
F. Danoix ◽  
E. Bémont ◽  
P. Maugis ◽  
D. Blavette

1983 ◽  
Vol 25 ◽  
Author(s):  
T. T. Tsong

ABSTRACTThe early stages of silicide formation on metal and silicon surfaces have been studied in the atom-probe FIM. Precursors to silicide formation are low temperature diffusion of single Si atoms, their interactions, and adsorption layer superstructure formation. These phenomena have been studied quantitatively. At high temperatures, silicide films can be formed. Four distinctive stages of silicide formation on tungsten surfaces have been observed from the atomically resolved FIM images. Formation of silicide layers on platinum, nickel, and silicon surfaces have also been studied. From both the atom-probe compositional depth profiling and the FIM observation one can conclude that the interface formed at low temperature is sharp. At high temperature, Si atoms can diffuse deep into a Pt matrix and Ni atoms into a Si matrix. Conclusions drawn from these atom-probe studies are summarized, and future directions suggested.


Sign in / Sign up

Export Citation Format

Share Document