scholarly journals STATISTICAL ANALYSIS OF ATOM-PROBE DATA (I) : DERIVATION OF SOME FINE-SCALE FEATURES FROM FREQUENCY DISTRIBUTIONS FOR FINELY DISPERSED SYSTEMS

1988 ◽  
Vol 49 (C6) ◽  
pp. C6-433-C6-438 ◽  
Author(s):  
D. BLAVETTE ◽  
G. GRANCHER ◽  
A. BOSTEL
1986 ◽  
Vol 47 (C7) ◽  
pp. C7-489-C7-494
Author(s):  
L. V. ALVENSLEBEN ◽  
R. GRÜNE ◽  
A. HÜTTEN ◽  
M. OEHRING

1987 ◽  
Vol 48 (C6) ◽  
pp. C6-559-C6-564 ◽  
Author(s):  
M. G. Hetherington ◽  
M. K. Miller

1989 ◽  
Vol 50 (C8) ◽  
pp. C8-401-C8-406 ◽  
Author(s):  
A. BUCHON ◽  
A. BOSTEL ◽  
D. BLAVETTE

1989 ◽  
Vol 160 ◽  
Author(s):  
Ross A. D. Mackenzie ◽  
J. Alex Liddle ◽  
Chris R. M. Grovenor ◽  
Alfred Cerezo

AbstractThe pulsed laser atom probe has been used to characterise the fine scale chemistry of a range of III-V ternary and quaternary compound semiconductors (GaInAs, AlInAs, GaAlInAs) grown, using MOCVD techniques, on indium phosphide substrates. It has been observed that there are fine scale chemical fluctuations in some specimens on a scale of typically 10–20 nm. The fluctuations appear to be a result of localized clustering of the group III components in the epilayer. In quaternary material there is evidence for different degrees of clustering for different components. It is suggested that this compositional fluctuation is a consequence of clustering occuring above a miscibility gap. The existence of a TEM contrast mechanism inherent to the material has the effect of making TEM an unreliable indicator of fine scale compositional variations in these systems.


1990 ◽  
Vol 186 ◽  
Author(s):  
M.G. Hetherington ◽  
J.M. Hyde ◽  
M.K. Miller

AbstractThe properties of many advanced alloys are derived from extremely fine-scale microstructures. This poses interesting questions about the measurement of composition on this scale. The phase separation of model Fe-Cr alloys has been been studied with the atom-probe. Statistical techniques have been used to estimate the composition and compare the results with the predictions of linear and non-linear theories of spinodal decomposition and the distributions obtained from Monte-Carlo calculations.


2014 ◽  
Vol 53 (1) ◽  
pp. 87-98
Author(s):  
Anna J. Kwiatkowska

Paper deals with the results of statistical analysis of the type of frequency distribution of species occuring in the field layers of two forest phytocoenoses. In the both cases frequency distributions were ranged out for the surface area of 1, 2, 4, 8, 16, 32 and 64 m<sup>2</sup>. The types of frequency distributions were determined on the grounds of the values of Fisher's and Pearson's K coefficients. Analysed distributions were classified into Pearson's system. Also the size of the sample plot at which the empirical frequency distributions were symetrical, from the statistical point of view, nad where they were U-shaped was determined.


Author(s):  
K. F. Russell ◽  
M. K. Miller

The atom probe field ion microscope (APFIM) is well suited to the characterization of the fine scale features and defects that are formed in materials due to exposure to neutron irradiation. However, in order for the technique to be effective, suitable specimens are required. Atom probe field ion microscopy specimens are in the form of ultrasharp needles that are usually produced by a series of mechanical and chemical or electrochemical methods. These needles have a typical end radius of approximately 10 to 50 nm and a taper angle of between 1 and 5. The small dimensions mean that the specimens are extremely fragile and difficult to handle and do not easily lend themselves to remote operations in a hot cell. The small size and mass of the APFIM specimen has the advantage that the amount of material required is minimal.A concept in working with irradiated materials is to keep exposure to the operator "as low as reasonably achievable" (ALARA).


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