scholarly journals Evidence for structural transitions in onedimensional organic conductor TMA-TCNQ-I obtained by high voltage electron diffraction at low temperature

1982 ◽  
Vol 43 (8) ◽  
pp. 285-290 ◽  
Author(s):  
T. Granier ◽  
R. Ayroles
Keyword(s):  
Electron Diffraction ◽  
Low Temperature ◽  
High Voltage ◽  
Organic Conductor ◽  
Structural Transitions ◽  
Voltage Electron ◽  
High Voltage Electron

Size-Effect Diffuse Scattering in High Voltage Electron Diffraction from Disordered α-CuAl

1982 ◽  
Vol 21 ◽  
Author(s):  
J.R. Sellar ◽  
D. Imeson
Keyword(s):  
Electron Diffraction ◽  
Size Effect ◽  
High Voltage ◽  
Research Activity ◽  
Atomic Size ◽  
Voltage Electron ◽  
High Voltage Electron ◽  
Interstitial Defects ◽  
Average Lattice ◽  
Elastic Strain Field

Strain plays an important role in many solid-state phase transformations and strain-related order parameters have recently been a topic of considerable research activity. Long range strain fields due to dislocations [1] and the strain around interstitial defects [2] have also come under study by electron diffraction and imaging methods. In this note we report the observation of weak, asymmetric diffuse size-effect scattering (SES) in a dilute partially-ordered binary alloy (Cu - 16.7 at. % Al) under dynamical diffraction conditions in a high-voltage electron microscope (HVEM) operating at around 305 kV. The asymmetry, which is of odd parity around the sharp peaks of the average lattice of the alloy crystal, is due to an elastic strain field associated with atoms displaced from their average positions in the lattice, as a consequence of their difference in atomic size.

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