Application of capacitor insertion method to scanning tunneling microscopes

1989 ◽  
Vol 60 (10) ◽  
pp. 3119-3122 ◽  
Author(s):  
Hiroshi Kaizuka
Keyword(s):  
Scanning Tunneling ◽  
Insertion Method ◽  
Scanning Tunneling Microscopes

Image-Based Trajectory Estimation for Scanning Tunneling Microscopy

2007 ◽  
Author(s):  
G. M. Clayton ◽  
S. Devasia
Keyword(s):  
Experimental Investigation ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Probe Position ◽  
Tunneling Microscopy ◽  
Positioning Accuracy ◽  
Trajectory Estimation ◽  
Nano Scale ◽  
Calibration Sample ◽  
Scanning Tunneling Microscopes

In this article we present an image-based approach to estimate the probe position trajectory in scanning tunneling microscopes (STMs). STMs are key enabling tools in the experimental investigation and manipulation of nano and sub-nano scale phenomena; however, due to an inability to measure the STM-probe position, typical STMs are limited to low bandwidth operations to ensure positioning accuracy. To overcome sensor deficiencies, thus enabling higher bandwidth STMs, an image-based method which produces discrete samples of the STM-tip trajectory has been developed. In this article we explore how the STM calibration sample and the output affect the reconstructability of the STM trajectory.

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