High-resolution x-ray spectrometer based on spherically bent crystals for investigations of femtosecond laser plasmas

1998 ◽  
Vol 69 (12) ◽  
pp. 4049-4053 ◽  
Author(s):  
B. K. F. Young ◽  
A. L. Osterheld ◽  
D. F. Price ◽  
R. Shepherd ◽  
R. E. Stewart ◽  
...  
2001 ◽  
Vol 19 (2) ◽  
pp. 285-293 ◽  
Author(s):  
T.A. PIKUZ ◽  
A. YA. FAENOV ◽  
M. FRAENKEL ◽  
A. ZIGLER ◽  
F. FLORA ◽  
...  

The shadow monochromatic backlighting (SMB) scheme, a modification of the well-known soft X-ray monochromatic backlighting scheme, is proposed. It is based on a spherical crystal as the dispersive element and extends the traditional scheme by allowing one to work with a wide range of Bragg angles and thus in a wide spectral range. The advantages of the new scheme are demonstrated experimentally and supported numerically by ray-tracing simulations. In the experiments, the X-ray backlighter source is a laser-produced plasma, created by the interaction of an ultrashort pulse, Ti:Sapphire laser (120 fs, 3–5 mJ, 1016 W/cm2 on target) or a short wavelength XeCl laser (10 ns, 1–2 J, 1013 W/cm2 on target) with various solid targets (Dy, Ni + Cr, BaF2). In both experiments, the X-ray sources are well localized spatially (∼20 μm) and are spectrally tunable in a relatively wide wavelength range (λ = 8–15 Å). High quality monochromatic (δλ/λ ∼ 10−5–10−3) images with high spatial resolution (up to ∼4 μm) over a large field of view (a few square millimeters) were obtained. Utilization of spherically bent crystals to obtain high-resolution, large field, monochromatic images in a wide range of Bragg angles (35° < Θ < 90°) is demonstrated for the first time.


2014 ◽  
Vol 21 (4) ◽  
pp. 762-767 ◽  
Author(s):  
Ari-Pekka Honkanen ◽  
Roberto Verbeni ◽  
Laura Simonelli ◽  
Marco Moretti Sala ◽  
Ali Al-Zein ◽  
...  

Wavelength-dispersive high-resolution X-ray spectrometers often employ elastically bent crystals for the wavelength analysis. In a preceding paper [Honkanenet al.(2014).J. Synchrotron Rad.21, 104–110] a theory for quantifying the internal stress of a macroscopically large spherically curved analyser crystal was presented. Here the theory is applied to compensate for the corresponding decrease of the energy resolution. The technique is demonstrated with a Johann-type spectrometer using a spherically bent Si(660) analyser in near-backscattering geometry, where an improvement in the energy resolution from 1.0 eV down to 0.5 eV at 9.7 keV incident photon energy was observed.


1997 ◽  
Vol 68 (9) ◽  
pp. 3412-3420 ◽  
Author(s):  
Richard Sauneuf ◽  
Jean-Michel Dalmasso ◽  
Thierry Jalinaud ◽  
Jean-Pierre Le Breton ◽  
Daniel Schirmann ◽  
...  

1992 ◽  
Author(s):  
Jeffrey A. Koch ◽  
Phillip J. Batson ◽  
Michael R. Carter ◽  
Karen L. Chapman ◽  
Luiz B. Da Silva ◽  
...  

2004 ◽  
Author(s):  
Cristina G. Serbanescu ◽  
Jaime Santiago ◽  
Robert Fedosejevs

2008 ◽  
Vol 28 (6) ◽  
pp. 1220-1224
Author(s):  
王瑞荣 Wang Ruirong ◽  
陈伟民 Chen Weimin ◽  
董佳钦 Dong Jiaqin ◽  
熊俊 Xiong Jun ◽  
傅思祖 Fu Sizu

Author(s):  
Y. Aglitskiy ◽  
T. Lehecka ◽  
S. Obenschain ◽  
S. Bodner ◽  
C. Pawley ◽  
...  

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