High-k titanium silicate dielectric thin films grown by pulsed-laser deposition

2002 ◽  
Vol 80 (2) ◽  
pp. 294-296 ◽  
Author(s):  
D. K. Sarkar ◽  
E. Desbiens ◽  
M. A. El Khakani
2007 ◽  
Vol 515 (16) ◽  
pp. 6548-6551 ◽  
Author(s):  
Mehmet Alper Sahiner ◽  
Joseph C. Woicik ◽  
Peng Gao ◽  
Patrick McKeown ◽  
Mark C. Croft ◽  
...  

2001 ◽  
Vol 56 (1-2) ◽  
pp. 191-194 ◽  
Author(s):  
Jinfeng Kang ◽  
Xiaoyan Liu ◽  
Guijun Lian ◽  
Zhaohui Zhang ◽  
Guangcheng Xiong ◽  
...  

1993 ◽  
Vol 334 ◽  
Author(s):  
John W. Hastie ◽  
David W. Bonnell ◽  
Albert J. Paul ◽  
Peter K. Schenck

AbstractIn the context of “chemistry and its effects on film quality,” we and a number of other research groups have developed spectroscopic and modeling approaches to better define the pulsed laser deposition process. An overview of these approaches is given here, using the results of recent work performed in our laboratory on the oxide dielectric systems of BaTiO3 and PbZr0.53Ti0.47O3(PZT).


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