Studies of electronic structure of ZnO grain boundary and its proximity by using spatially resolved electron energy loss spectroscopy

2002 ◽  
Vol 81 (2) ◽  
pp. 277-279 ◽  
Author(s):  
H. C. Ong ◽  
J. Y. Dai ◽  
G. T. Du
1997 ◽  
Vol 482 ◽  
Author(s):  
M. K. H. Natusch ◽  
G. A. Botton ◽  
R. F. Broom ◽  
P. D. Brown ◽  
D. M. Tricker ◽  
...  

AbstractThe optical properties and their modification by crystal defects of wurtzite GaN are investigated using spatially resolved electron energy-loss spectroscopy (EELS) in a dedicated ultra-high vacuum field emission gun scanning transmission electron microscope. The calculated density of states of the bulk crystal reproduces well the features of the measured spectra. The profound effect of a prismatic stacking fault on the local electronic structure is shown by the spatial variation of the optical properties derived from low-loss spectra. It is found that a defect state at the fault appears to bind 1.5 electrons per atom.


2006 ◽  
Vol 12 (S02) ◽  
pp. 1156-1157
Author(s):  
Q Li ◽  
J Dai ◽  
X Gong

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006


1994 ◽  
Vol 332 ◽  
Author(s):  
Haral MÜllejans ◽  
J. Bruley ◽  
R. H. French ◽  
P. A. Morris

ABSTRACTValence electron energy-loss (EEL) spectroscopy in a dedicated scanning transmission electron microscope (STEM) has been used to study the Σ11 grain boundary in α-A12O3 in comparison with bulk α-A12O3. The interband transition strength was derived by Kramers-Kronig analysis and the electronic structure followed from quantitative critical point (CP) modelling. Thereby differences in the acquired spectra were related quantitatively to differences in the electronic structure at the grain boundary. The band gap at the boundary was slightly reduced and the ionicity increased. This work demonstrates for the first time that quantitative analysis of spatially resolved (SR) valence EEL spectra is possible. This represents a new avenue to electronic structure information from localized structures.


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