scholarly journals Role of S∕Se ratio in chemical bonding of As–S–Se glasses investigated by Raman, x-ray photoelectron, and extended x-ray absorption fine structure spectroscopies

2005 ◽  
Vol 98 (5) ◽  
pp. 053503 ◽  
Author(s):  
Wenyan Li ◽  
Sudipta Seal ◽  
Clara Rivero ◽  
Cedric Lopez ◽  
Kathleen Richardson ◽  
...  
2006 ◽  
Vol 110 (51) ◽  
pp. 25578-25581 ◽  
Author(s):  
Ikuyo Nakai ◽  
Hiroshi Kondoh ◽  
Toru Shimada ◽  
Masanari Nagasaka ◽  
Reona Yokota ◽  
...  

2021 ◽  
Vol 402 ◽  
pp. 123734
Author(s):  
F. Pinakidou ◽  
M. Katsikini ◽  
S. Varitis ◽  
Ph. Komninou ◽  
G. Schuck ◽  
...  

2015 ◽  
Vol 53 (18) ◽  
pp. 2075-2078 ◽  
Author(s):  
Tomoyasu Hirai ◽  
Masanao Sato ◽  
Makoto Kido ◽  
Yusuke Nagae ◽  
Katsuhiro Kaetsu ◽  
...  

Polyhedron ◽  
2001 ◽  
Vol 20 (5) ◽  
pp. 461-466 ◽  
Author(s):  
Anthony D. Covington* ◽  
Graham S. Lampard ◽  
Ozlem Menderes ◽  
Alan V. Chadwick ◽  
Georgios Rafeletos ◽  
...  

1991 ◽  
Vol 185-189 ◽  
pp. 841-842 ◽  
Author(s):  
H. Oyanagi ◽  
Y. Yokoyama ◽  
H. Yamaguchi ◽  
T. Katayama ◽  
Y. Nishihara ◽  
...  

1996 ◽  
Vol 437 ◽  
Author(s):  
A.F. Jankowski ◽  
I. Jimenez ◽  
J.P. Hayes ◽  
D.K. Shuh ◽  
W.M. Tong ◽  
...  

AbstractNear-edge x-ray absorption fine structure (NEXAFS) is used to examine the chemical bonding in boron and boron-nitride films sputter deposited from a fully-dense, pure boron target. Reactive sputtering is used to prepare the boron-nitride and multilayered films. Although the process of sputter deposition often produces films that lack long range order, NEXAFS reveals the distinguishing features of sp2 and sp3 hybridization that are associated with different crystalline structures. The sensitivity of NEXAFS to local order further provides details in bonding modifications that exist in these films.


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