Deformation stacking fault probability and dislocation microstructure of cold worked Cu–Sn–5Zn alloys by x-ray diffraction line profile analysis

Journal of Applied Physics ◽

10.1063/1.2356906 ◽

2006 ◽

Vol 100 (7) ◽

pp. 073509 ◽

Author(s):

S. N. Dey ◽

P. Chatterjee ◽

S. P. Sen Gupta

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Stacking Fault ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

Fault Probability ◽

X Ray ◽

Diffraction Line Profile ◽

Cold Worked ◽

Stacking Fault Probability

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An X-ray diffraction line profile analysis in cold-worked Fcc Cu-1Zn-Sn and Ag-1Zn-Sn alloys: Role of 1 wt pct Zn

Metallurgical Transactions A ◽

10.1007/bf02698259 ◽

1990 ◽

Vol 21 (5) ◽

pp. 1319-1322 ◽

Author(s):

A. K. Maity ◽

S. P. Sen Gupta

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile ◽

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Effect of Si content on the stacking fault energy in γ-Fe–Mn–Si–C alloys: Part I. X-ray diffraction line profile analysis

Materials Science and Engineering A ◽

10.1016/j.msea.2009.02.031 ◽

2009 ◽

Vol 516 (1-2) ◽

pp. 73-77 ◽

Author(s):

Xing Tian ◽

Yansheng Zhang

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Stacking Fault ◽

Stacking Fault Energy ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile ◽

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An x‐ray diffraction line profile analysis on the microstructure of cold‐worked face‐centered‐cubic Cu‐Mn‐Si alloys: Effects of Mn and Si as solutes

Journal of Applied Physics ◽

10.1063/1.341662 ◽

1988 ◽

Vol 64 (5) ◽

pp. 2324-2327 ◽

Author(s):

S. K. Pradhan ◽

M. De

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

Face Centered Cubic ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile ◽

Cold Worked ◽

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An X-ray diffraction line profile analysis in cold- worked Fcc Ag-1Sn-Zn alloys: Role of 1 wt pct Sn

Metallurgical Transactions A ◽

10.1007/bf02656551 ◽

1990 ◽

Vol 21 (4) ◽

pp. 1327-1330

Author(s):

A. K. Maity ◽

S. P. Sen Gupta

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile ◽

Cold Worked ◽

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An x-ray diffraction line profile analysis in cold-worked hexagonal (σ)-phase and mixed (α+σ)-phase of copper-germanium alloys

Metallurgical Transactions A ◽

10.1007/bf02650149 ◽

1989 ◽

Vol 20 (6) ◽

pp. 1142-1144 ◽

Author(s):

A. K. Maity ◽

S. K. Pradhan ◽

M. De ◽

S. P. Sen Gupta

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Σ Phase ◽

Diffraction Line Profile ◽

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An X-ray diffraction line profile analysis in cold- worked Fcc Ag-1Sn-Zn alloys: Role of 1 wt pct Sn

Metallurgical Transactions A ◽

10.1007/bf02698262 ◽

1990 ◽

Vol 21 (5) ◽

pp. 1327-1330 ◽

Author(s):

A. K. Maity ◽

S. P. Sen Gupta

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile ◽

Cold Worked ◽

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X-Ray diffraction line profile analysis on the microstructure of cold-worked face-centered cubic Cu-Ge-Si alloys: Effects of dilute solutes Si and GE

Metallurgical Transactions A ◽

10.1007/bf02663219 ◽

1989 ◽

Vol 20 (9) ◽

pp. 1883-1885 ◽

Author(s):

S. K. Pradhan ◽

M. De

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

Face Centered Cubic ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile ◽

Cold Worked ◽

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An X-ray diffraction line profile analysis in cold-worked Fcc Cu-1Zn-Sn and Ag-1Zn-Sn alloys: Role of 1 wt pct Zn

Metallurgical Transactions A ◽

10.1007/bf02656548 ◽

1990 ◽

Vol 21 (4) ◽

pp. 1319-1322

Author(s):

A. K. Maity ◽

S. P. Sen Gupta

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile ◽

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Stacking fault energies of fcc fe-Ni alloys by x-ray diffraction line profile analysis

Metallurgical Transactions A ◽

10.1007/bf02642831 ◽

1976 ◽

Vol 7 (3) ◽

pp. 359-363 ◽

Author(s):

Raymond E. Schramm ◽

Richard P. Reed

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Stacking Fault ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Ni Alloys ◽

Diffraction Line Profile ◽

Stacking Fault Energies

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Microhardness evaluation of Cu–Ni multilayered films by X-ray diffraction line profile analysis

Thin Solid Films ◽

10.1016/s0040-6090(98)00366-6 ◽

1998 ◽

Vol 324 (1-2) ◽

pp. 162-164 ◽

Author(s):

F.L Shan ◽

Z.M Gao ◽

Y.M Wang

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

Multilayered Films ◽

X Ray ◽

Diffraction Line Profile

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